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Power Semiconductor Devices and Circuits
  • Language: en
  • Pages: 401

Power Semiconductor Devices and Circuits

This symposium was the sCientific-technical event of the centennial celebration of the Asea Brown Boveri Switzerland. The purpose was to assess the present state of the art as well as shaping the basis for future progress in the area of power devices and related power circuits. The merger of Brown Boveri (BBC) with Asea to Asea Brown Boveri (ABB) three years ago gave new stimulus and enriched the technical substance of the symposium. By 1991, 100 years after the formation of BBC in Switzerland as a single company, this organization has been decentralized, forming 35 independent ABB companies. One of them - ABB Semiconductors Ltd. - directly deals with the power semiconductor business. These ...

Semiconductor Devices for Power Conditioning
  • Language: en
  • Pages: 374

Semiconductor Devices for Power Conditioning

The Brown Boveri Symposia are by now part of firmly established tradition. This is the seventh event in a series which was initiated shortly afer Corporate Research was established as a separate entity within our Company; the Symposia are held every other year. The themes to date have been 1969 Flow Research on Blading 1971 Real-Time Control of Electric Power Systems 1973 High-Temperature Materials in Gas Turbines 1975 Nonemissive Electrooptic Displays 1977 Current Interruption in High-Voltage Networks 1979 Surges in High-Voltage Networks 1981 Semiconductor Devices for Power Conditioning Why have we chosen these titles? At the outset we established certain selection criteria; we felt that a ...

Nondestructive Evaluation of Semiconductor Materials and Devices
  • Language: en
  • Pages: 791

Nondestructive Evaluation of Semiconductor Materials and Devices

From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.

Technology CAD Systems
  • Language: en
  • Pages: 313

Technology CAD Systems

As the cost of developing new semiconductor technology at ever higher bit/gate densities continues to grow, the value of using accurate TCAD simu lation tools for design and development becomes more and more of a necessity to compete in today's business. The ability to tradeoff wafer starts in an advanced piloting facility for simulation analysis and optimization utilizing a "virtual fab" S/W tool set is a clear economical asset for any semiconductor development company. Consequently, development of more sophisticated, accurate, physics-based, and easy-to-use device and process modeling tools will receive continuing attention over the coming years. The cost of maintaining and paying for one'...

Fundamentals of Power Semiconductor Devices
  • Language: en
  • Pages: 1104

Fundamentals of Power Semiconductor Devices

Fundamentals of Power Semiconductor Devices provides an in-depth treatment of the physics of operation of power semiconductor devices that are commonly used by the power electronics industry. Analytical models for explaining the operation of all power semiconductor devices are shown. The treatment here focuses on silicon devices but includes the unique attributes and design requirements for emerging silicon carbide devices. The book will appeal to practicing engineers in the power semiconductor device community.

Official Gazette of the United States Patent Office
  • Language: en
  • Pages: 854

Official Gazette of the United States Patent Office

  • Type: Book
  • -
  • Published: 1969-02
  • -
  • Publisher: Unknown

None

Digest of Technical Papers
  • Language: en
  • Pages: 1056

Digest of Technical Papers

  • Type: Book
  • -
  • Published: 1989
  • -
  • Publisher: Unknown

None

Conference Record, Industry Applications Society, IEEE-IAS ... Annual Meeting
  • Language: en
  • Pages: 1492
The Brown Boveri Review
  • Language: en
  • Pages: 722

The Brown Boveri Review

  • Type: Book
  • -
  • Published: 1987
  • -
  • Publisher: Unknown

None

ISPSD '92
  • Language: en
  • Pages: 372