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Oscillation-Based Test in Mixed-Signal Circuits
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner u...
DCIS2002
Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países
Oscillation-Based Test in Mixed-Signal Circuits
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Low-Voltage CMOS Log Companding Analog Design
Low-Voltage CMOS Log Companding Analog Design presents in detail state-of-the-art analog circuit techniques for the very low-voltage and low-power design of systems-on-chip in CMOS technologies. The proposed strategy is mainly based on two bases: the Instantaneous Log Companding Theory, and the MOSFET operating in the subthreshold region. The former allows inner compression of the voltage dynamic-range for very low-voltage operation, while the latter is compatible with CMOS technologies and suitable for low-power circuits. The required background on the specific modeling of the MOS transistor for Companding is supplied at the beginning. Following this general approach, a complete set of CMOS...
