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Specimen Handling, Preparation, and Treatments in Surface Characterization
  • Language: en
  • Pages: 316

Specimen Handling, Preparation, and Treatments in Surface Characterization

With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ray, and ion beam techniques to determine the structure and composition of interfaces, activities in the field of surface science grew nearly exponentially. Today surface science impacts all major fields of study from physical to biological sciences, from physics to chemistry, and all engineering disciplines. The materials and phenomena characterized by surface science range from se- conductors, where the impact of surface science has been critical to progress, to metals and ceramics, where selected contributions have been important, to bio- terials, where contributions are just beginning to impact...

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
  • Language: en
  • Pages: 447

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

Microweighing in Vacuum and Controlled Environments
  • Language: en
  • Pages: 419

Microweighing in Vacuum and Controlled Environments

  • Type: Book
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  • Published: 2012-12-02
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  • Publisher: Elsevier

Methods and Phenomena, 4: Their Applications in Science and Technology: Microweighing in Vacuum and Controlled Environments focuses on the principles, methodologies, and approaches involved in micro mass measurements. The selection first elaborates on introduction and microbalance review, beam microbalance design, construction and operation, and sources of error in microweighing in controlled environments. Discussions focus on Brownian motion, Knudsen forces, gravitational forces, microbalance construction and operation, auxiliary equipment for operation of a vacuum microbalance, undesirable disturbances or forces, calibration techniques, and classification of various types of microbalances....

Ion Spectroscopies for Surface Analysis
  • Language: en
  • Pages: 479

Ion Spectroscopies for Surface Analysis

Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sp...

Methods of Surface Analysis
  • Language: en
  • Pages: 496

Methods of Surface Analysis

  • Type: Book
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  • Published: 2012-12-02
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  • Publisher: Elsevier

Methods of Surface Analysis deals with the determination of the composition of surfaces and the identification of species attached to the surface. The text applies methods of surface analysis to obtain a composition depth profile after various stages of ion etching or sputtering. The composition at the solid—solid interface is revealed by systematically removing atomic planes until the interface of interest is reached, in which the investigator can then determine its composition. The book reviews the effect of ion etching on the results obtained by any method of surface analysis including the effect of the rate of etching, incident energy of the bombarding ion, the properties of the solid,...

Performance and Durability Assessment:
  • Language: en
  • Pages: 412

Performance and Durability Assessment:

  • Type: Book
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  • Published: 2004-10-09
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  • Publisher: Elsevier

2 real examples demonstrate how to obtain the service life of solar collector systems Durable, providing fundamentals that will continue to be valuable over the next 5-10 years Lighting a pathway to the commercialisation of solar products Solar devices lose their performance over time. The rate of degradation controls the service life of these devices. The essential concepts used to assess durability and performance of two specific solar collector systems are described, enabling researchers to assess durability in other solar devices. The examples of modelling, testing and performance measurements give researchers a how-to approach to reach crucial service lifetime predictions. Achieving suc...

Surface Infrared and Raman Spectroscopy
  • Language: en
  • Pages: 278

Surface Infrared and Raman Spectroscopy

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.

Responding to National Needs
  • Language: en
  • Pages: 1044

Responding to National Needs

  • Type: Book
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  • Published: 2000
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  • Publisher: Unknown

None

NIST Special Publication
  • Language: en
  • Pages: 1044

NIST Special Publication

  • Type: Book
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  • Published: 2000
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  • Publisher: Unknown

None

Research Grants Index
  • Language: en
  • Pages: 854

Research Grants Index

  • Type: Book
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  • Published: 1968
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  • Publisher: Unknown

None