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This book brings together papers presented at the 3rd International Conference on Artificial Intelligence in China (ChinaAI), which provides a venue to disseminate the latest developments and to discuss the interactions and links between these multidisciplinary fields. Spanning topics covering all topics in Artificial Intelligence with new development in China, this book is aimed at undergraduate and graduate students in Electrical Engineering, Computer Science and Mathematics, researchers and engineers from academia and industry as well as government employees (such as NSF, DOD, DOE, etc).
V. The Legal Context
The discovery of the Fractional Fourier Transform and its role in optics and data management provides an elegant mathematical framework within which to discuss diffraction and other fundamental aspects of optical systems. This book explains how the fractional Fourier transform has allowed the generalization of the Fourier transform and the notion of the frequency transform. It will serve as the standard reference on Fourier transforms for many years to come.
The 39-volume set, comprising the LNCS books 13661 until 13699, constitutes the refereed proceedings of the 17th European Conference on Computer Vision, ECCV 2022, held in Tel Aviv, Israel, during October 23–27, 2022. The 1645 papers presented in these proceedings were carefully reviewed and selected from a total of 5804 submissions. The papers deal with topics such as computer vision; machine learning; deep neural networks; reinforcement learning; object recognition; image classification; image processing; object detection; semantic segmentation; human pose estimation; 3d reconstruction; stereo vision; computational photography; neural networks; image coding; image reconstruction; object recognition; motion estimation.
This book presents the fabrication of optoelectronic nanodevices. The structures considered are nanowires, nanorods, hybrid semiconductor nanostructures, wide bandgap nanostructures for visible light emitters and graphene. The device applications of these structures are broadly explained. The book deals also with the characterization of semiconductor nanostructures. It appeals to researchers and graduate students.
Selected, peer reviewed papers from the 5th International Conference on Manufacturing Science and Engineering (ICMSE 2014), April 19-20, 2014, Shanghai, China