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This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.
X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de velopment of optical elements for soft x-rays render x-ray microscopy feasi ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium ...
Can a scientific instrument be regarded as a failure? Why and how? By shedding light on the complexity of these questions, the volume marks a step forward in the way historical scientific instruments can be analysed and displayed. The essays show how diverse failures can be, and how the assessment of scientific devices may change over time — some surprisingly becoming more successful. In addition to studies of how technical features led to failure, the authors examine the roles played by social bias and behaviour, commercial and economic circumstances, and political factors.
A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Curved x-ray multilayer mirrors focus synchrotron beams down to tens of nano metres. A wave-optical theory describing propagation of two waves in an elliptically curved focusing multilayer mirror is developed in this thesis. Using numerical integration, the layer shapes can be optimised for reflectivity and aberrations. Within this framework, performance of both existing and currently upgraded synchrotron beamlines is simulated. Using a more theoretical model case, limits of the theory are studied. A significant part of this work is dedicated to partial spatial coherence, modelled using the method of stochastic superpositions. Coherence propagation and filtering by x-ray waveguides is shown ...