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Three-Dimensional X-Ray Diffraction Microscopy
  • Language: en
  • Pages: 176

Three-Dimensional X-Ray Diffraction Microscopy

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

1st International Conference on 3D Materials Science, 2012
  • Language: en
  • Pages: 242

1st International Conference on 3D Materials Science, 2012

  • Type: Book
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  • Published: 2016-12-02
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  • Publisher: Springer

Addressing a critical growth area in materials science, this volume features papers presented at the 2012 International Conference on 3D Materials Science, organized by The Minerals, Metals & Materials Society (TMS). With the top researchers in the world assessing the state-of-the-art within the various elements of three-dimensional materials science, this collection provides the premier forum for authoritative presentations on all aspects of the science, including characterization, visualization, quantitative analysis, modeling, and investigation of structure-property relationships of materials.

1st International Conference on 3D Materials Science, 2012
  • Language: en
  • Pages: 264

1st International Conference on 3D Materials Science, 2012

Addressing a critical growth area in materials science, this volume features papers presented at the 2012 International Conference on 3D Materials Science, organized by The Minerals, Metals & Materials Society (TMS). With the top researchers in the world assessing the state-of-the-art within the various elements of three-dimensional materials science, this collection provides the premier forum for authoritative presentations on all aspects of the science, including characterization, visualization, quantitative analysis, modeling, and investigation of structure-property relationships of materials.

Three-Dimensional X-Ray Diffraction Microscopy
  • Language: en
  • Pages: 172

Three-Dimensional X-Ray Diffraction Microscopy

  • Type: Book
  • -
  • Published: 2014-01-15
  • -
  • Publisher: Springer

None

The 2nd International Congress on 3D Materials Science
  • Language: en
  • Pages: 138

The 2nd International Congress on 3D Materials Science

  • Type: Book
  • -
  • Published: 2016-12-01
  • -
  • Publisher: Springer

This is a collection of papers presented at the 2nd International Congress on 3D Materials Science, an event organized by The Minerals, Metals & Materials Society (TMS). The conference provides the premier forum for presentations of current interest and significance to the three-dimensional characterization, visualization, quantitative analysis, modeling, and investigation of structure-property relationships of materials. The papers presented in the collection are divided into six sections: (1) Acquisition and Handling of 3D Data; (2) Microstructure/Property Relationship in 3D: Characterization and Simulation; (3) Microstructure/Property Relationship in 3D: Deformation and Damage; (4) New Experimental Techniques; (5) Analysis at the Nanoscale; and (6) Dynamic Processes.

Strain and Dislocation Gradients from Diffraction
  • Language: en
  • Pages: 478

Strain and Dislocation Gradients from Diffraction

This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dis...

Studies of High-Temperature Superconductors - Advances in Research and Applications
  • Language: en
  • Pages: 208

Studies of High-Temperature Superconductors - Advances in Research and Applications

Studies of High Temperature Superconductors, Volume 36 - The BSCCO System -- II

Advances in Discrete Tomography and Its Applications
  • Language: en
  • Pages: 401

Advances in Discrete Tomography and Its Applications

The book provides a unified presentation of new methods, algorithms, and select applications that are the foundations of multidimensional image construction and reconstruction. The self-contained survey chapters, written by leading mathematicians, engineers, and computer scientists, present cutting-edge research and results in the field. Three main areas are covered: theoretical results, algorithms, and practical applications. Following an historical and introductory overview of the field, the book explores the various mathematical and computational problems of discrete tomography with an emphasis on new applications.

Oxygen Ordering and Superconductivity in the Tc Superconductor YBa2Cu306+x
  • Language: en
  • Pages: 94

Oxygen Ordering and Superconductivity in the Tc Superconductor YBa2Cu306+x

  • Type: Book
  • -
  • Published: 1991
  • -
  • Publisher: Unknown

None

Neutrons and Synchrotron Radiation in Engineering Materials Science
  • Language: en
  • Pages: 460

Neutrons and Synchrotron Radiation in Engineering Materials Science

Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.