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Electron Microscopy
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Diffraction and Imaging Techniques in Material Science P1
Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on the interaction between matter and radiation. It classifies the possible methods of observation by making a list of radiations on the basis of wavelength, including ions, X-ray photons, neutrons, and electrons. It also discusses transmission electron microscopy, the weak-beam method of electron microscopy, and some applications of transmission electron microscopy to phase transitions. Organized into 13 chapters, this volume begins with an overview of the kinematic theory of electron diffraction and the ways to treat diffraction by a def...
Modulated Structure Materials
Proceedings of the NATO Advanced Study Institute on Modulated Structure Materials, Maleme-Chania, Greece, June 15-25, 1983
Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals
Modulated crystals have been intensively investigated over the past several years and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials. This book brings together for the first time the crystallographic descriptions and experimental methods for the structural and microstructural analysis of modulated crystals as described by well-known researchers in the various areas. The emphasis is on charge density wave modulations, and the detailed analysis of the prototypical NbTe4/TaTe4 system gives practical applications of the methods. Scanning Tunnelling Microscopy is a new technique providing significant new insights into atomic scale details of the modulations' structures and a chapter on this method is included.
Electron Microscopy in Mineralogy
During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man ches...
Geometry and Thermodynamics
Distinct scientific communities are usually involved in the three fields of quasi-crystals, of liquid crystals, and of systems having modulated crystalline structures. However, in recent years, there has been a growing feeling that a number of common problems were encountered in the three fields. These comprise the need to recur to "exotic" spaces for describing the type of order of the atomic or molecular configurations of these systems (Euclidian "superspaces" of dimensions greater than 3, or 4-dimensional curved spaces); the recognition that one has to deal with geometrically frustrated systems, and also the occurence of specific excitations (static or dynamic) resulting from the continuo...
Electron Diffraction Techniques
Volume 2 deals with those aspects when there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.
Methods Of Structural Analysis Of Modulated Structures And Quasicrystals
By introducing the superspace formalism, the methods of structure analysis of incommensurate structures have achieved in the past few years a full maturity. The superspace description is also becoming in the field of quasicrystals the main tool to approach a systematic method of structure determination of these materials. According to the program of the Workshop, these proceedings are an introduction to the formalism and practice of structure determination of modulated structures (incommensurate and commensurate) and quasiperiodic systems, mainly under the unifying framework of the superspace description. Accordingly, a large set of tutorial introductory chapters written by well-known specialists are included. The main refinement programs available for incommensurate structures are presented by their authors. The book also contains the most recent contributions from more than thirty of the participants in the Workshop, focusing on the problem of the structure analysis of these typical materials by means of diffraction methods.
Industrial Applications Of Electron Microscopy
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.
