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If science has the equivalent of a Bloomsbury group, it is the five men born at the turn of the twentieth century in Budapest: Theodore von Karman, Leo Szilard, Eugene Wigner, John von Neumann, and Edward Teller. From Hungary to Germany to the United States, they remained friends and continued to work together and influence each other throughout their lives. As a result, their work was integral to some of the most important scientific and political developments of the twentieth century. They were an extraordinary group of talents: Wigner won a Nobel Prize in theoretical physics; Szilard was the first to see that a chain reaction based on neutrons was possible, initiated the Manhattan Project...
A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.
An Institute like ours cannot help but lend credence to the notion of the late Derek J. de Solla Price of Yale University that "the scientific revolution was largely the improvement, invention and use of a series of instruments . . . . that expanded the reach of science in innumerable directions". Most of science today and in years gone by depends on the experimental observation of struc ture on the small scale with microscopes, and on the large scale with telescopes. The first instruments to expand the observational range of the human eye were simple optical systems, designed in the case of microscopes and telescopes to magnify the image. The big breakthrough in the 17th century was not whe...
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
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Master the physics and understand the current applications of modern X-ray and EUV sources with this fully updated second edition.