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Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
This book describes how evolutionary algorithms (EA), including genetic algorithms (GA) and particle swarm optimization (PSO) can be utilized for solving multi-objective optimization problems in the area of embedded and VLSI system design. Many complex engineering optimization problems can be modelled as multi-objective formulations. This book provides an introduction to multi-objective optimization using meta-heuristic algorithms, GA and PSO and how they can be applied to problems like hardware/software partitioning in embedded systems, circuit partitioning in VLSI, design of operational amplifiers in analog VLSI, design space exploration in high-level synthesis, delay fault testing in VLSI testing and scheduling in heterogeneous distributed systems. It is shown how, in each case, the various aspects of the EA, namely its representation and operators like crossover, mutation, etc, can be separately formulated to solve these problems. This book is intended for design engineers and researchers in the field of VLSI and embedded system design. The book introduces the multi-objective GA and PSO in a simple and easily understandable way that will appeal to introductory readers.
Data Mining and Diagnosing IC Fails
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.
Texas Instruments Incorporated (TI) Patent Landscape Analysis – January 1, 1994 to December 31, 2013
The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company. The analysis employs two frequently used patent classification methods: US Patent Classification (UPC) and International Patent Classification (IPC). Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data. The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area.
Applications of Nuclear Materials
Over the decades, nuclear materials have been used in different domains for the development of human civilization. Our knowledge of nuclear properties, initially restricted to the basic physics, has now spawned many applications in other areas of science and beyond, such as in forensic science, material science, nuclear medicine, etc. Recent advancements in science and technology have paved a path towards the establishment and growth of nuclear technology and industries. This book will cover the recent developments in the field of nuclear science and technology and its applications in various sectors. Covering both fundamental and advanced aspects in an accessible way, this textbook begins with an overview of applications of nuclear material, helping readers to familiarize themselves with the various theoretical and experimental developments and aims to elaborate various aspects of nuclear materials in the health and energy sectors.
ISTFA 2011
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International Symposium on Quality Electronic Design
Annotation Fifty-one papers and 21 posters from the March 2002 symposium report current research in deep submicron integrated circuit design and development. The sessions address interconnect extraction and modeling, design for process variations, metrics, power and noise management, verification, signal integrity, and low power design techniques. Some of the topics are transition aware global signaling (TAGS), the interoperability of EDA tools for sequential logic synthesis, statistical methods for the determination of process corners, power supply noise suppression via clock skew scheduling, and the relation between SAT and BDDs for equivalence checking. No subject index. Annotation copyrighted by Book News Inc., Portland, OR.
Proceedings
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
17th IEEE VLSI Test Symposium
The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
