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Under Eastern Eyes
Twelve studies explicitly developed to elaborate on travel writing published in book form by east Europeans travelling in Europe from ca. 1550 to 2000. How did east Europeans have positioned themselves with relation to the notion of Europe, and how has the genre of travel writing served as a means of exploring and disseminating these ideas?
A Bibliography of East European Travel Writing on Europe
The bibliography volume of the three-volume East Looks West: East European Travel Writing in Europe collates travel writing published in book form by east Europeans travelling in Europe from ca. 1550 to 2000. It is intended as a fundamental research tool, collecting together travel writings within each national/linguistic tradition, and enabling comparative analysis of such material. It fills an important gap in the existing reference literature, both in western and east European languages, and will be of use to those working in the growing fields of comparative travel writing, regional and national identities, and postcolonialism.These texts exist in surprisingly large numbers, and include ...
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Mukl
Kolik ran dokáže člověk přijmout, než učiní falešné doznání? Kniha inspirovaná skutečným příběhem muže, který byl, ve vykonstruovaném procesu, odsouzen k patnácti letům odnětí svobody. V pouhých 19 letech prošel velmi krutými výslechovými metodami StB a na vlastní kůži okusil lidskou krutost v její nejsyrovější podobě.
Semiconductor Power Devices
Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.
