Welcome to our book review site go-pdf.online!
You may have to Search all our reviewed books and magazines, click the sign up button below to create a free account.
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal ...
Radiopathology of Organs and Tissues
The biologic effects of radiation on normal tissues and tumors represent a complex area for investigation. These effects are of far-reaching consequence to the diagnostic radiologist and the radiation oncologist having a significant impact not only in concepts relative to radiation protection but also in concepts relative to tumor biology and its response to radiation injury. The volume edited by SCHERER, STREFFER, and TROTT represents an extension of basic radiation biology data into the effects of radiation in producing pathology in organs and tissues. The data presented by the multiple authors involved in this text cover essentially all tissues in the body with specific definition of radi...
Advanced Techniques in Biological Electron Microscopy III
This volume is a continuation of two prior books on advanced electron microscope techniques. The purpose of this series has been to provide in depth analyses of methods which are considered to be at the leading edge of electron microscopic research procedures with applications in the biological sciences. The mission of the present volume remains that of a source book for the research practitioner or advanced student, especially one already well versed in basic electron optical methods. It is not meant to provide in troductory material, nor can this modest volume hope to cover the entire spectrum of advanced technology now available in electron microscopy. In the past decade, computers have found their way into many research laboratories thanks to the enormous increase in computing power and stor age available at a modest cost. The ultrastructural area has also benefited from this expansion in a number of ways which will be illustrated in this volume. Half of the contributions discuss technologies that either directly or indirectly make extensive use of computer methods.
Material Characterization Techniques For Beginners
Characterization is the most important step in the study of materials. The various techniques used for material characterization gives one the knowledge about structure and properties of materials. The present book titled "Material Characterization Techniques for Beginners" is intended to expose readers to various techniques available for material characterization. The book is divided into four themes, Imaging Techniques, Spectroscopy. Diffraction and Scattering Techniques and Electrical Characterization Techniques. The present book is multidisciplinary and designed to be a complete reference book for students at undergraduate and postgraduate level. The book deals with various techniques available for material characterization under the four themes mentioned above. The principle and working of each technique are explained in a simple and lucid language. Also, it includes the application of these techniques and which technique to be used for a particular study.
The Journal of Cell Biology
No. 2, pt. 2 of November issue each year from v. 19-47; 1963-70 and v. 55- 1972- contain the Abstracts of papers presented at the annual meeting of the American Society for Cell Biology, 3d-10th; 1963-70 and 12th- 1972- .
Optik
None
Scanning Electron Microscopy
Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.
