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EMC 2008
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Transmission Electron Microscopy
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
Optical and electrical properties of topological insulator Bi2Se3
Topological insulator is one of the hottest research topics in solid state physics. This is the first book to describe the vibrational spectroscopies and electrical transport of topological insulator Bi2Se3, one of the most exciting areas of research in condensed matter physics. In particular, attempts have been made to summarize and develop the various theories and new experimental techniques developed over years from the studies of Raman scattering, infrared spectroscopy and electrical transport of topological insulator Bi2Se3. It is intended for material and physics researchers and graduate students doing research in the field of optical and electrical properties of topological insulators, providing them the physical understanding and mathematical tools needed to engage research in this quickly growing field. Some key topics in the emerging field of topological insulators are introduced.
1st International Conference on 3D Materials Science, 2012
Addressing a critical growth area in materials science, this volume features papers presented at the 2012 International Conference on 3D Materials Science, organized by The Minerals, Metals & Materials Society (TMS). With the top researchers in the world assessing the state-of-the-art within the various elements of three-dimensional materials science, this collection provides the premier forum for authoritative presentations on all aspects of the science, including characterization, visualization, quantitative analysis, modeling, and investigation of structure-property relationships of materials.
Microscopy of Semiconducting Materials
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.
Applications of Microscopy in Materials and Life Sciences
This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume include papers on aberration corrected TEM & STEM, SEM – FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging associated with bio-nanotechnology, medical applications, host-pathogen interaction, etc. This book will be beneficial to researchers, educators, and practitioners alike.
Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures: Volume 163
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
