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A Practical Guide to Surface Metrology
This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characte...
Optical Properties of Nanoparticle Systems
Filling the gap for a description of the optical properties of small particles with sizes less than 1000 nm and to provide a comprehensive overview on the spectral behavior of nanoparticulate matter, this is the most up-to-date reference on the optical physics of nanoparticle systems. The author, an expert in the field with both academic and industrial experience, concentrates on the linear optical properties, elastic light scattering and absorption of single nanoparticles and on reflectance and transmittance of nanoparticle matter.
A Practical Guide to Optical Metrology for Thin Films
A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of...
Optical Particle Sizing
Optical particle s1z1ng is undoubtedly a fascinating field of research of the utmost practical importance. In the Universe fluids are nearly everywhere, and when they occur they almost invariably contain particles. Inside our bodies we can take the example of blood transporting a vi tal procession of red and white cells. Around us, we can find various particles in the air we breathe, bubbles in the champagne or the soda we drink, or natural and artificial (polluting!) particles in the lakes we swim in. Industrial processes and systems are also concerned with particles, from pulverized coal flames to fluidized beds, in a range of applications involving rocket exhausts, pneuma tic transport an...
Polymer Films with Embedded Metal Nanoparticles
This book presents an overview of nanostructure determination and ways to find relationships to the electronic and optical properties. The methods described can be applied to a large number of other granular metal-insulator systems and used as a guideline for characterisation and modelling. In addition, the book describes the manufacture of artificially structured nanomaterials using laser or electron-beam irradiation.
Practical Determination of Optical Constants from Spectral Measurements
Optical constants are specific properties of condensed matter that allow to describe in a simple way the interaction of light or other electromagnetic radiation with matter. There is always a requirement for optical constants values for estimating colour, reflection, internal total reflection, refraction, scattering, phase shifting, multilayer properties, or thin film thickness. This book is concerned with the practical determination of optical constants from easily accomplishable reflectance or transmittance measurements with reflectometers or ellipsometers. It provides information on the basics of optical constants and a comprehensive overview on models for optical constants. A brief overview on methods of measurement and evaluation is followed by guidelines to the practical determination of optical constants mainly of thin films on a substrate. The main task is always to find the best suited model for the parametrization of the optical constants.
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