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Designed to give a concise but complete overview of the field, this book features contributions written by leading experts in the various areas. Topics include design, materials, film growth, deposition including large area, characterization and monitoring, and mechanical stress.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Professor Hunsperger's Integrated Optics is one of the few texts that is comprehensive and thorough enough for use both as a classroom text (practice problems are included) and as a specialist's reference. The gratifying success of the first two editions and the continuing rapid development of the field necessitated the writing of this third edition. All chapters have been revised and updated, and a new chapter, on quantum well devices, has been added. As in the previous editions, detailed descriptions of the phenomena, devices, and technology used in optical integrated circuits and their relationship to fiber optics are presented. The trend of telecommunications toward the use of single mod...
This is an introduction to electron holography, a newly developed technique for observing and measuring microscopic structures of matter and fields using the wave nature of electrons. It describes principles, experimental details, and observation examples for vortices in superconductors, the magnetic domain structure in ferromagnets, and for fundamental phenomena of quantum mechanics.
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