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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
  • Language: en
  • Pages: 343

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Bayesian Econometrics
  • Language: en
  • Pages: 656

Bayesian Econometrics

Illustrates the scope and diversity of modern applications, reviews advances, and highlights many desirable aspects of inference and computations. This work presents an historical overview that describes key contributions to development and makes predictions for future directions.

Understanding Socioeconomic Differences in Health. An Economic Approach
  • Language: en
  • Pages: 226
Modelling and forecasting stock return volatility and the term structure of interest rates
  • Language: en
  • Pages: 286

Modelling and forecasting stock return volatility and the term structure of interest rates

This dissertation consists of a collection of studies on two areas in quantitative finance: asset return volatility and the term structure of interest rates. The first part of this dissertation offers contributions to the literature on how to test for sudden changes in unconditional volatility, on modelling realized volatility and on the choice of optimal sampling frequencies for intraday returns. The emphasis in the second part of this dissertation is on the term structure of interest rates.

Renewal and Resistance
  • Language: en
  • Pages: 296

Renewal and Resistance

  • Type: Book
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  • Published: 2010
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  • Publisher: Peter Lang

The Roman Catholic Church has always been concerned with the quality of the music used in the liturgy, and the essays in this volume trace the church's efforts, during the nineteenth century and the first half of the twentieth, to cultivate a more appropriate liturgical music for its Latin Rite. The task of restoration - expressed, for example, in the chant revival associated with the monks of Solesmes, the efforts of the Cecilian movement, and Pius X's determination to reform sacred music in the universal church - is a recurring theme in the book. Meanwhile resistance, particularly to the reforms decreed by the pope's 1903 motu proprio, also finds a voice in the volume. The essays collected here describe selected scenes and episodes from the unending story of imperfect human beings trying to express in their music the perfection of God.

Ethics in Econometrics
  • Language: en
  • Pages: 309

Ethics in Econometrics

Econometricians make choices on data, models, and estimation routines. Using various examples, this book shows the consequences of choices.

Social Inequality
  • Language: en
  • Pages: 1044

Social Inequality

Inequality in income, earnings, and wealth has risen dramatically in the United States over the past three decades. Most research into this issue has focused on the causes—global trade, new technology, and economic policy—rather than the consequences of inequality. In Social Inequality, a group of the nation's leading social scientists opens a wide-ranging inquiry into the social implications of rising economic inequality. Beginning with a critical evaluation of the existing research, they assess whether the recent run-up in economic inequality has been accompanied by rising inequality in social domains such as the quality of family and neighborhood life, equal access to education and he...

Defect Oriented Testing for CMOS Analog and Digital Circuits
  • Language: en
  • Pages: 317

Defect Oriented Testing for CMOS Analog and Digital Circuits

Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors h...

Proceedings
  • Language: en
  • Pages: 680

Proceedings

  • Type: Book
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  • Published: 1997
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  • Publisher: Unknown

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SAMT
  • Language: en
  • Pages: 546

SAMT

  • Type: Book
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  • Published: 2008
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  • Publisher: Unknown

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