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Advanced Data Acquisition and Intelligent Data Processing
DAQ and data processing is a basic part of all automated production systems, diagnostic systems, watching over quality of production, energy distribution, transport control or in various other areas. Demands on the speed, accuracy and reliability increase in general. It is possible to achieve not only using superior (but also more expensive) hardware, but also applying advanced data acquisition and intelligent data processing. It deals e.g. optimal data fusion of a number of sensors, new stochastic methods for accuracy increasing, new algorithms for acceleration of data processing, etc. These are the grounds for publishing this book. Advanced Data Acquisition and Intelligent Data Processing ...
Advanced Distributed Measuring Systems - Exhibits of Application
Measuring systems are an essential part of all automated production systems, they also serve to ensure quality of production or they are used to assure the reliability and safety in various areas. The same applies in principle likewise for fields of telecommunication, energy production and distribution, health care etc. Similarly no serious scientific research in the field of natural and technical sciences can be performed without objective data about the investigated object, which are usually acquired using measuring system. Demands on the speed and accuracy of measurement increase in all areas in general. These are the grounds for publishing this book.The book "Advanced distributed measuri...
IEEE Instrumentation and Measurement Technology Conferencer, 1999
The conference will cover all aspects of theory and practice of metrology, measurement technologies, instrumentation, and related applications.
Optoelectronics, Photonic Devices, and Optical Networks
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
