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On-Line Testing for VLSI
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
What Went Right
This book explores why Nepal's hydropower sector is one of its few development success stories. Unlike most other 'developing' countries, in Nepal local firms design and build hydropower facilities using Nepali engineers, builders and labor. Nepal has largely avoided the trap whereby most poor countries are forced to accept energy infrastructure projects that are foreign designed, funded and built – typically resulting in debt, dependency and unsustainability. It traces the struggle between two competing development paradigms: one that emphasizes gradual national human capacity building – at the expense of speed and efficiency – and another that emphasizes rapid, large-scale infrastructure building – at the risk of unsustainability and dependency. At stake is whether what passes for 'development' benefits the countries in which it occurs, or the banks and investors that finance capital-intensive projects. What Went Right brings a vision for sustainable development into vigorous conversation with development strategies that have proven to be less productive.
Integrated Circuit Manufacturability
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the...
Field Programmable Logic and Applications
This book contains the papers presented at the 13th International Workshop on Field Programmable Logic and Applications (FPL) held on September 1–3, 2003. The conference was hosted by the Institute for Systems and Computer Engineering-Research and Development of Lisbon (INESC-ID) and the Depa- ment of Electrical and Computer Engineering of the IST-Technical University of Lisbon, Portugal. The FPL series of conferences was founded in 1991 at Oxford University (UK), and has been held annually since: in Oxford (3 times), Vienna, Prague, Darmstadt,London,Tallinn,Glasgow,Villach,BelfastandMontpellier.Itbrings together academic researchers, industrial experts, users and newcomers in an - formal,...
Machine Learning for Embedded System Security
This book comprehensively covers the state-of-the-art security applications of machine learning techniques. The first part explains the emerging solutions for anti-tamper design, IC Counterfeits detection and hardware Trojan identification. It also explains the latest development of deep-learning-based modeling attacks on physically unclonable functions and outlines the design principles of more resilient PUF architectures. The second discusses the use of machine learning to mitigate the risks of security attacks on cyber-physical systems, with a particular focus on power plants. The third part provides an in-depth insight into the principles of malware analysis in embedded systems and describes how the usage of supervised learning techniques provides an effective approach to tackle software vulnerabilities.
VLSI Design and Test
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Advances in Computer Systems Architecture
On behalf of the program committee, we were pleased to present this year’s program for ACSAC: Asia-Paci?c Computer Systems Architecture Conference. Now in its ninth year, ACSAC continues to provide an excellent forum for researchers, educators and practitioners to come to the Asia-Paci?c region to exchange ideas on the latest developments in computer systems architecture. This year, the paper submission and review processes were semiautomated using the free version of CyberChair. We received 152 submissions, the largest number ever.Eachpaperwasassignedatleastthree,mostlyfour,andinafewcaseseven ?ve committee members for review. All of the papers were reviewed in a t- monthperiod,duringwhichtheprogramchairsregularlymonitoredtheprogress of the review process. When reviewers claimed inadequate expertise, additional reviewers were solicited. In the end, we received a total of 594 reviews (3.9 per paper) from committee members as well as 248 coreviewers whose names are acknowledged in the proceedings. We would like to thank all of them for their time and e?ort in providing us with such timely and high-quality reviews, some of them on extremely short notice.
Reasoning in Boolean Networks
Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. The book presents the central idea of approaching design automation problems for logic-level circuits by specific Boolean reasoning techniques. While Boolean reasoning techniques have been a central element of two-level circuit theory for many decades Reasoning in Boolean Networks describes a basic reasoning methodology for multi-level circuits. This leads to a unified view on two-level and multi-level logic synthesis. The presented reasoning techniques are applied to various CAD-problems to demonst...
Emerging Nanotechnologies
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Progress in VLSI Design and Test
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
