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International Multidisciplinary Microscopy Congress
  • Language: en
  • Pages: 286

International Multidisciplinary Microscopy Congress

The International Multidisciplinary Microscopy Congress (INTERM2013) was organized on October 10-13, 2013. The aim of the congress was to bring together scientists from various branches to discuss the latest advances in the field of microscopy. The contents of the congress have been broadened to a more "interdisciplinary" scope, so as to allow all scientists working on related subjects to participate and present their work. These proceedings include 39 peer-reviewed technical papers, submitted by leading academic and research institutions from over 12 countries and representing some of the most cutting-edge research available. The 39 papers are grouped into the following sections: - Applications of Microscopy in the Physical Sciences - Applications of Microscopy in the Biological Sciences

July 1
  • Language: en
  • Pages: 644

July 1

No detailed description available for "July 1".

Handbook of Silicon Carbide Materials and Devices
  • Language: en
  • Pages: 465

Handbook of Silicon Carbide Materials and Devices

  • Type: Book
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  • Published: 2023-07-10
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  • Publisher: CRC Press

This handbook presents the key properties of silicon carbide (SiC), the power semiconductor for the 21st century. It describes related technologies, reports the rapid developments and achievements in recent years, and discusses the remaining challenging issues in the field. The book consists of 15 chapters, beginning with a chapter by Professor W. J. Choyke, the leading authority in the field, and is divided into four sections. The topics include presolar SiC history, vapor-liquid-solid growth, spectroscopic investigations of 3C-SiC/Si, developments and challenges in the 21st century; CVD principles and techniques, homoepitaxy of 4H-SiC, cubic SiC grown on 4H-SiC, SiC thermal oxidation processes and MOS interface, Raman scattering, NIR luminescent studies, Mueller matrix ellipsometry, Raman microscopy and imaging, 4H-SiC UV photodiodes, radiation detectors, and short wavelength and synchrotron X-ray diffraction. This comprehensive work provides a strong contribution to the engineering, materials, and basic science knowledge of the 21st century, and will be of interest to material growers, designers, engineers, scientists, postgraduate students, and entrepreneurs.

Journal of Nano Research
  • Language: en
  • Pages: 100

Journal of Nano Research

This periodical edition includes peer-reviewed scientific and engineering papers on all aspects of research in the area of nanoscience and nanotechnologies and wide practical application of the achieved results.

Applied Crystallography XXI
  • Language: en
  • Pages: 318

Applied Crystallography XXI

Volume is indexed by Thomson Reuters CPCI-S (WoS). The goal of this collection is to provide an opportunity for researchers working in many different fields to showcase their latest achievements in the area of structural studies, as applied to the materials commonly used in industry. Emphasis is placed upon topics such as the development of methods and techniques in X-ray studies, crystal structure determination methods, the crystallography of phase transformations, texture analysis, material structures – metals and alloys, ceramics, polymers, thin films, quasicrystals, amorphous materials, nanomaterials and molecular crystals.

HeteroSiC & WASMPE 2011
  • Language: en
  • Pages: 270

HeteroSiC & WASMPE 2011

Selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France

Compound Semiconductor Bulk Materials And Characterizations
  • Language: en
  • Pages: 408

Compound Semiconductor Bulk Materials And Characterizations

This book is concerned with compound semiconductor bulk materials, and has been written for students, researchers and engineers in material science and device fabrication. It provides the elementary and intermediate knowledge of compound semiconductor bulk materials necessary for entry into this field. The first volume described the physical properties, crystal growth technologies, principles of crystal growth, various defects in crystals, characterization techniques and applications, and reviewed various III-V and II-V compound semiconductor materials. In this second volume, other materials are reviewed, including those that have recently received attention such as GaN, AlN, SiC and ZnO for optical and electronic devices.

Gallium Nitride and Silicon Carbide Power Technologies
  • Language: en
  • Pages: 361
Field Effect in Semiconductor-Electrolyte Interfaces
  • Language: en

Field Effect in Semiconductor-Electrolyte Interfaces

This book presents a state-of-the-art understanding of semiconductor-electrolyte interfaces. It provides a detailed study of semiconductor-electrolyte interfacial effects, focusing on the physical and electrochemical foundations that affect surface charge, capacitance, conductance, quantum effects, and other properties, both from the point of view of theoretical modeling and metrology. The wet-dry interface, where solid-state devices may be in contact with electrolyte solutions, is of growing interest and importance. This is because such interfaces will be a key part of hydrogen energy and solar cells, and of sensors that would have wide applications in medicine, genomics, environmental scie...

Advances in Innovative Materials and Applications
  • Language: en
  • Pages: 523

Advances in Innovative Materials and Applications

Volume is indexed by Thomson Reuters CPCI-S (WoS). This volume is divided into 3 chapters. The first, focused on Materials and Elaboration Techniques, describes various types of material such as composites, polymers, semiconductors, metals, ceramics, bio-materials, inorganic alloys, textile, porous, crystalline, amorphous and hybrids elaborated by various means such as vapor-phase, liquid-phase, plasma, ion-based and laser-assisted techniques, soft chemistry, self- assembly, bonding, sintering, and including bulk, surface, interface, thin-film and nano-materials. The second chapter, on Characterization Techniques and Properties, covers both physical (optical, structural, electrical, mechanic...