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In-situ Electron Microscopy at High Resolution
  • Language: en
  • Pages: 318

In-situ Electron Microscopy at High Resolution

In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

Classical Theory Of Crystal Dislocations: From Iron To Gallium Nitride
  • Language: en
  • Pages: 379

Classical Theory Of Crystal Dislocations: From Iron To Gallium Nitride

The book consists of two parts: Part 1 is a standard text of dislocation theory. Mathematics is avoided as much as possible. Part 2 describes application of dislocation theory, which includes mechanical properties (including the inverse temperature dependence of strength) and dislocations in functional materials such as Si, GaN and SiC and dislocations in a thin crystal such as an epitaxial layer. This is what has been long anticipated among researchers in industry.The book contains about 330 illustrations (mostly originals by the author) and the pictures obtained by the author by means of in-situ experiment in a transmission electron microscope over the past 50 years.This book includes many exercises, which the author found useful when he was teaching in Department of Materials Science and Engineering of Nagoya University to stimulate their interests in dislocation theory.

Dislocations in Solids
  • Language: en
  • Pages: 691

Dislocations in Solids

  • Type: Book
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  • Published: 2023-03-08
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  • Publisher: CRC Press

This volume comprises the Proceedings of the Yamada Conference IX on Dislocations in Solids, held in August 1984 in Tokyo. The purpose of the conference was two-fold: firstly to evaluate the increasing data on basic properties of dislocations and their interaction with other types of defects in solids and, secondly, to increase understanding of the material properties brought about by dislocation-related phenomena. Metals and alloys, semi-conductors and ions crystals were discussed. One of the important points of contention was the electronic state at the core of dislocation. Another was the dislocation model of amorphous structure.

The Transmission Electron Microscope
  • Language: en
  • Pages: 396

The Transmission Electron Microscope

The book "The Transmission Electron Microscope" contains a collection of research articles submitted by engineers and scientists to present an overview of different aspects of TEM from the basic mechanisms and diagnosis to the latest advancements in the field. The book presents descriptions of electron microscopy, models for improved sample sizing and handling, new methods of image projection, and experimental methodologies for nanomaterials studies. The selection of chapters focuses on transmission electron microscopy used in material characterization, with special emphasis on both the theoretical and experimental aspect of modern electron microscopy techniques. I believe that a broad range of readers, such as students, scientists and engineers will benefit from this book.

Advances in Electronic Ceramic Materials
  • Language: en
  • Pages: 218

Advances in Electronic Ceramic Materials

The focus of this collection is on recent research and development related to a variety of sensor technologies as well as the latest advances concerning the synthesis and characterization of dielectric, piezoelectric, and ferroelectric materials.

The Growth of Electron Microscopy
  • Language: en
  • Pages: 919

The Growth of Electron Microscopy

As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Carbon Alloys
  • Language: en
  • Pages: 594

Carbon Alloys

  • Type: Book
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  • Published: 2003
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  • Publisher: Elsevier

In recent years the Japanese have funded a comprehensive study of carbon materials which incorporate other elements including boron, nitrogen and fluorine, hence the title of the project "Carbon Alloys". Coined in 1992, the phrase "Carbon Alloys" can be applied to those materials mainly composed of carbon materials in multi-component systems. The carbon atoms of each component have a physical and/or chemical interactive relationship with other atoms or compounds. The carbon atoms of the components may have different hybrid bonding orbitals to create quite different carbon components. Eiichi Yasuda and his team consider the definition of Carbon Alloys, present the results of the Carbon Alloys...

Critical Currents In Superconductors - Proceedings Of The 8th International Workshop
  • Language: en
  • Pages: 538

Critical Currents In Superconductors - Proceedings Of The 8th International Workshop

This workshop includes about 110 papers describing the flux pinning and related electromagnetic phenomena in superconductors. Various problems are argued on exotic properties of flux lines, flux dynamics, flux pinning mechanisms, critical current density and critical state phenomena in both high- and low-temperature superconductors.

Official Gazette of the United States Patent and Trademark Office
  • Language: en
  • Pages: 822

Official Gazette of the United States Patent and Trademark Office

  • Type: Book
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  • Published: 2002
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  • Publisher: Unknown

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Proceedings: Microscopy and Microanalysis 2002: Volume 8
  • Language: en
  • Pages: 556

Proceedings: Microscopy and Microanalysis 2002: Volume 8

This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and Microanalysis 2002 meeting held in Québec City, Québec, Canada on August 4-9, 2002. The Proceedings consists of both a printed volume containing the extended abstracts of all invited papers as well as a searchable CD-ROM containing the extended abstracts of all papers presented at the meeting --whether invited or submitted, platform or poster.