Welcome to our book review site go-pdf.online!

You may have to Search all our reviewed books and magazines, click the sign up button below to create a free account.

Sign up

Raman Imaging
  • Language: en
  • Pages: 388

Raman Imaging

  • Type: Book
  • -
  • Published: 2012-07-27
  • -
  • Publisher: Springer

Raman imaging has long been used to probe the chemical nature of a sample, providing information on molecular orientation, symmetry and structure with sub-micron spatial resolution. Recent technical developments have pushed the limits of micro-Raman microscopy, enabling the acquisition of Raman spectra with unprecedented speed, and opening a pathway to fast chemical imaging for many applications from material science and semiconductors to pharmaceutical drug development and cell biology, and even art and forensic science. The promise of tip-enhanced raman spectroscopy (TERS) and near-field techniques is pushing the envelope even further by breaking the limit of diffraction and enabling nano-Raman microscopy.

Wide Bandgap Semiconductors for Power Electronics
  • Language: en
  • Pages: 743

Wide Bandgap Semiconductors for Power Electronics

Wide Bandgap Semiconductors for Power Electronic A guide to the field of wide bandgap semiconductor technology Wide Bandgap Semiconductors for Power Electronics is a comprehensive and authoritative guide to wide bandgap materials silicon carbide, gallium nitride, diamond and gallium(III) oxide. With contributions from an international panel of experts, the book offers detailed coverage of the growth of these materials, their characterization, and how they are used in a variety of power electronics devices such as transistors and diodes and in the areas of quantum information and hybrid electric vehicles. The book is filled with the most recent developments in the burgeoning field of wide ban...

Silicon Carbide
  • Language: en
  • Pages: 528

Silicon Carbide

This book prestigiously covers our current understanding of SiC as a semiconductor material in electronics. Its physical properties make it more promising for high-powered devices than silicon. The volume is devoted to the material and covers methods of epitaxial and bulk growth. Identification and characterization of defects is discussed in detail. The contributions help the reader to develop a deeper understanding of defects by combining theoretical and experimental approaches. Apart from applications in power electronics, sensors, and NEMS, SiC has recently gained new interest as a substrate material for the manufacture of controlled graphene. SiC and graphene research is oriented towards end markets and has high impact on areas of rapidly growing interest like electric vehicles. The list of contributors reads like a "Who's Who" of the SiC community, strongly benefiting from collaborations between research institutions and enterprises active in SiC crystal growth and device development.

Phonons in Semiconductor Nanostructures
  • Language: en
  • Pages: 490

Phonons in Semiconductor Nanostructures

In the last ten years, the physics and technology of low dimensional structures has experienced a tremendous development. Quantum structures with vertical and lateral confinements are now routinely fabricated with feature sizes below 100 run. While quantization of the electron states in mesoscopic systems has been the subject of intense investigation, the effect of confinement on lattice vibrations and its influence on the electron-phonon interaction and energy dissipation in nanostructures received atten tion only recently. This NATO Advanced Research Workshop on Phonons in Sem iconductor Nanostructures was a forum for discussion on the latest developments in the physics of phonons and thei...

Computer Methods and Experimental Measurements for Surface Effects and Contact Mechanics VIII
  • Language: en
  • Pages: 353

Computer Methods and Experimental Measurements for Surface Effects and Contact Mechanics VIII

  • Type: Book
  • -
  • Published: 2007
  • -
  • Publisher: WIT Press

The importance of contact and surface problems in modern engineering and their combined effects has led to the Eighth International Conference on Computer Methods and Experimental Measurements for Surface and Contact Mechanics. Nowadays the importance of contact and surface problems in many technological fields is well understood: they are complex and inherently non-linear due to their moving boundaries and the different properties of materials, particularly along the contact surfaces. Structural components fail from wear, corrosion, high cycle fatigue etc., that is to say affected and initiated by the surface conditions. The use of surface treatments can reduce the cost of components and extend the life of the elements. Their effect is of particular importance in the case of surfaces undergoing contact, a problem which is addressed throughout the book. Topics featured: Surface Treatment; Surface problems in Contact Mechanics; Fracture Mechanics; Coupled analysis and experiments; Thin Coatings; Thick Coatings; Contact Mechanics; Material Surface in Contact; Applications and Case Studies.

Advances in Applied Science, Engineering and Technology
  • Language: en
  • Pages: 975

Advances in Applied Science, Engineering and Technology

Selected, peer reviewed papers from the 2013 International Conference on Applied Science, Engineering and Technology (ICASET 2013), May 19-21, 2013, Qingdao, China

Comptes rendus de l'Académie des sciences
  • Language: en
  • Pages: 720

Comptes rendus de l'Académie des sciences

  • Type: Book
  • -
  • Published: 2000
  • -
  • Publisher: Unknown

None

Graphene
  • Language: en
  • Pages: 3132

Graphene

Aggregated Book

Transducers ’01 Eurosensors XV
  • Language: en
  • Pages: 1763

Transducers ’01 Eurosensors XV

  • Type: Book
  • -
  • Published: 2016-05-12
  • -
  • Publisher: Springer

The Conference is the premier international meeting for the presentation of original work addressing all aspects of the theory, design, fabrication, assembly, packaging, testing and application of solid-state sensors, actuators, MEMS, and microsystems.

Silicon Carbide and Related Materials 2003
  • Language: en
  • Pages: 836

Silicon Carbide and Related Materials 2003

  • Type: Book
  • -
  • Published: 2004
  • -
  • Publisher: Unknown

None