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Characterization and Control of Interfaces for High Quality Advanced Materials
Interface characterization and control are critical in the design and manufacture of high quality advanced materials, particularly, for nanomaterials. This proceedings features papers on interface science and technology that provide a unique and state-of-the art perspective on interface characterization and control. Articles from scientists and engineers from 11 different countries address interface control, high temperature interfaces, nanoparticle design, nanotechnology, suspension control, novel processing, particulate materials, microstructure, and hot gas cleaning. This unique volume will serve as a valuable reference for scientists and engineers interested in interfaces, particulate materials, and nanotechnology. Proceedings of the International Conference on ICCCI 2003, Kurashiki, Japan, 2003; Ceramic Transactions, Volume 146.
Failure Analysis of Microbiologically Influenced Corrosion
Failure Analysis of Microbiologically Influenced Corrosion serves as a complete guide to corrosion failure analysis with an emphasis on the diagnosis of microbiologically influenced corrosion (MIC). By applying the principles of chemistry, microbiology, and metallurgy, readers will be able to reliably determine the mechanistic cause of corrosion damage and failures and select the appropriate methods for mitigating future corrosion incidents. FEATURES Provides background information on the forensic process, types of data or evidence needed to perform the analysis, industrial case studies, details on the MIC failure analysis process, and protocols for field and lab use Presents up-to-date advances in molecular technologies and their application to corrosion failure investigations Offers specific guidelines for conducting MIC failure analyses and case studies to illustrate their application Examines state-of-the-art information on MIC analytical tools and methods With authors with expertise in microbiology, corrosion, materials, and failure investigation, this book provides tools for engineers, scientists, and technologists to successfully combat MIC issues.
