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Nanotribology and Nanomechanics II
  • Language: en
  • Pages: 1025

Nanotribology and Nanomechanics II

The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.

Nanotribology and Nanomechanics
  • Language: en
  • Pages: 1530

Nanotribology and Nanomechanics

This volume serves as a timely, practical introduction to the principles of nanotribology and nanomechanics and applications to magnetic storage systems and MEMS/NEMS. Assuming some familiarity with macrotribology/mechanics, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. Graduate students, research workers, and practicing engineers will find the book of value.

Nanotribology and Nanomechanics I
  • Language: en
  • Pages: 633

Nanotribology and Nanomechanics I

The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
  • Language: en
  • Pages: 503

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical propert...

Surface Diffusion
  • Language: en
  • Pages: 701

Surface Diffusion

The interest in the problem of surface diffusion has been steadily growing over the last fifteen years. This is clearly evident from the increase in the number of papers dealing with the problem, the development of new experimental techniques, and the specialized sessions focusing on diffusion in national and international meetings. Part of the driving force behind this increasing activity is our recently acquired ability to observe and possibly control atomic scale phenomena. It is now possible to look selectively at individual atomistic processes and to determine their relative importance during growth and reactions at surfaces. The number of researchers interested in this problem also has...

Fractals, Scaling and Growth Far from Equilibrium
  • Language: en
  • Pages: 700

Fractals, Scaling and Growth Far from Equilibrium

A comprehensive, 1998 account of the practical aspects and pitfalls of the applications of fractal modelling in the physical sciences.

Springer Handbook of Nanotechnology
  • Language: en
  • Pages: 1968

Springer Handbook of Nanotechnology

Since 2004 and with the 2nd edition in 2006, the Springer Handbook of Nanotechnology has established itself as the definitive reference in the nanoscience and nanotechnology area. It integrates the knowledge from nanofabrication, nanodevices, nanomechanics, Nanotribology, materials science, and reliability engineering in just one volume. Beside the presentation of nanostructures, micro/nanofabrication, and micro/nanodevices, special emphasis is on scanning probe microscopy, nanotribology and nanomechanics, molecularly thick films, industrial applications and microdevice reliability, and on social aspects. In its 3rd edition, the book grew from 8 to 9 parts now including a part with chapters on biomimetics. More information is added to such fields as bionanotechnology, nanorobotics, and (bio)MEMS/NEMS, bio/nanotribology and bio/nanomechanics. The book is organized by an experienced editor with a universal knowledge and written by an international team of over 150 distinguished experts. It addresses mechanical and electrical engineers, materials scientists, physicists and chemists who work either in the nano area or in a field that is or will be influenced by this new key technology.

Scanning Probe Microscopy
  • Language: en
  • Pages: 1002

Scanning Probe Microscopy

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

CFN Lectures on Functional Nanostructures - Volume 2
  • Language: en
  • Pages: 187

CFN Lectures on Functional Nanostructures - Volume 2

This series of books contains selected and edited lectures from summer schools organized by the Center for Functional nanostructures (CFN) at the University of Karlsruhe. The mission of the CFN is to carry out research in the following areas: nanophotonics, nanoelectronics, molecular nanostructures and nanostructured materials. The aim of the summer schools is mainly to exchange new ideas and illustrate emerging research methodologies through a series of topical, introductory lectures. This is reflected by both the selection of topics addressed in the present volume, nanoelectronics, as well as the tutorial aspect of the contributions.