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"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
This book constitutes the refereed proceedings of the 7th International Conference on Intelligent Tutoring Systems, ITS 2004, held in Maceió, Alagoas, Brazil in August/September 2004. The 73 revised full papers and 39 poster papers presented together with abstracts of invited talks, panels, and workshops were carefully reviewed and selected from over 180 submissions. The papers are organized in topical sections on adaptive testing, affect, architectures for ITS, authoring systems, cognitive modeling, collaborative learning, natural language dialogue and discourse, evaluation, machine learning in ITS, pedagogical agents, student modeling, and teaching and learning strategies.
This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.