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Local Electrode Atom Probe Tomography
  • Language: en
  • Pages: 318

Local Electrode Atom Probe Tomography

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

Microstructural Geochronology
  • Language: en
  • Pages: 347

Microstructural Geochronology

Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the so...

Local Electrode Atom Probe Tomography
  • Language: en
  • Pages: 338

Local Electrode Atom Probe Tomography

  • Type: Book
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  • Published: 2013-12-31
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  • Publisher: Unknown

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Official Gazette of the United States Patent and Trademark Office
  • Language: en
  • Pages: 1474

Official Gazette of the United States Patent and Trademark Office

  • Type: Book
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  • Published: 2000
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  • Publisher: Unknown

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日本応用磁気学会誌
  • Language: ja
  • Pages: 522

日本応用磁気学会誌

  • Type: Book
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  • Published: 2005
  • -
  • Publisher: Unknown

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Annual Operating Report
  • Language: en
  • Pages: 422

Annual Operating Report

  • Type: Book
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  • Published: 1994
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  • Publisher: Unknown

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Michigan Ensian
  • Language: en
  • Pages: 428

Michigan Ensian

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Atom Probe Tomography
  • Language: en
  • Pages: 416

Atom Probe Tomography

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of ind...

Nondestructive Characterization of Materials II
  • Language: en
  • Pages: 750

Nondestructive Characterization of Materials II

The possibility of nondestructively characterizing the microstruc ture, morphology or mechanical properties of materials is certainly a fascinating subject. In principle, such techniques can be used at all stages of a material's life - from the early stages of processing, to the end of a structural component's useful life. Interest in the subject thus arises not only from a purely scientific point of view but is also strongly motivated by economic pressures to improve productivity and quality in manufacturing, to insure the reliability and extend the life of existing structures. The present volume represents the edited papers presented at the Second International Symposium on the Nondestruct...

Index of Patents Issued from the United States Patent and Trademark Office
  • Language: en
  • Pages: 2696

Index of Patents Issued from the United States Patent and Trademark Office

  • Type: Book
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  • Published: Unknown
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  • Publisher: Unknown

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