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Register of the Commission and Warrant Officers of the Navy of the United States, Including Officers of the Marine Corps
  • Language: en
  • Pages: 1112
Scanning Probe Lithography
  • Language: en
  • Pages: 145

Scanning Probe Lithography

  • Type: Book
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  • Published: 2022-12-22
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  • Publisher: CRC Press

The most complete book available on scanning probe lithography (SPL), this work details the modalities, mechanisms, and current technologies, applications, and materials on which SPL can be performed. It provides a comprehensive overview of this simple and cost-effective technique, which does not require clean room conditions and can be performed in any lab or industry facility to achieve high-resolution and high-quality patterns on a wide range of materials: biological, semiconducting, polymers, and 2D materials. • Introduces historical background of SPL, including evolution of the technique and tools • Explains the mechanism of sample modification/manipulation, types of AFM tips, techn...

A Semicentennial History of the American Mathematical Society, 1888-1938
  • Language: en
  • Pages: 344

A Semicentennial History of the American Mathematical Society, 1888-1938

This volume outlines the history of the AMS in its first fifty years. To download free chapters of this book, click here.

A Traitor and a Scoundrel
  • Language: en
  • Pages: 228

A Traitor and a Scoundrel

In 1856, Benjamin Hedrick broke with his white North Carolinian peers by taking an antislavery position on the question of the incorporation of the territories. This biography tells the story of how developed that position, the loss of his position as a professor of chemistry and his subsequent exil

Survey of Food and Nutrition Research in the United States ...
  • Language: en
  • Pages: 394
National Faculty Directory
  • Language: en
  • Pages: 2024

National Faculty Directory

  • Type: Book
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  • Published: 2008
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  • Publisher: Unknown

None

Document Retrieval Index
  • Language: en
  • Pages: 886

Document Retrieval Index

  • Type: Book
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  • Published: 1976
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  • Publisher: Unknown

None

Cumulated Index Medicus
  • Language: en
  • Pages: 1646

Cumulated Index Medicus

  • Type: Book
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  • Published: 1998
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  • Publisher: Unknown

None

Electrical Atomic Force Microscopy for Nanoelectronics
  • Language: en
  • Pages: 424

Electrical Atomic Force Microscopy for Nanoelectronics

  • Type: Book
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  • Published: 2019-08-01
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  • Publisher: Springer

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.