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Progress in VLSI Design and Test
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
VLSI Design and Test
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
VLSI Design and Test
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
VLSI Design and Test
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Vlsi And Parallel Computing For Pattern Recognition And Artificial Intelligence
This book covers parallel algorithms and architectures and VLSI chips for a range of problems in image processing, computer vision, pattern recognition and artificial intelligence. The specific problems addressed include vision and image processing tasks, Fast Fourier Transforms, Hough Transforms, Discrete Cosine Transforms, image compression, polygon matching, template matching, pattern matching, fuzzy expert systems and image rotation. The collection of papers gives the reader a good introduction to the state-of-the-art, while for an expert this serves as a good reference and a source of some new contributions in this field.
Proceedings
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Twelfth International Conference on VLSI Design
The proceedings of the January 1999 conference consist of 103 papers, 11 talks, and six tutorials. The papers are grouped under the headings of TCAD to ECAD, low power, testing, co-design and synthesis, analog design, multi-valued logic, verification, digital signal processor (DSP), logic synthesis,
