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2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID)
  • Language: en

2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID)

  • Type: Book
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  • Published: 2021-02-20
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  • Publisher: Unknown

The 34th International Conference on VLSI Design (VLSID 2021) is the premium global event held in India in the field of VLSI design, bringing together stakeholders that includes academia, industry, R&D houses and policy makers in the field of hardware and software system design, verification, test, EDA tools development, and manufacturing of electronic circuits It is a flagship event of VLSI Society of India (VSI) The 20th International Conference on Embedded Systems is collocated with VLSID 2021 The program will consist of regular paper sessions, special sessions, embedded tutorials, panel discussions, and tutorials

VLSI Design 2001
  • Language: en
  • Pages: 541

VLSI Design 2001

  • Type: Book
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  • Published: 2001
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  • Publisher: Unknown

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16th International Conference on VLSI Design
  • Language: en
  • Pages: 595

16th International Conference on VLSI Design

  • Type: Book
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  • Published: 2003-01-01
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  • Publisher: IEEE

This conference proceedings chose the theme of this year's conference as Design Convergence in System-on-a-Chip (SOC) Design. The papers are divided into sections that include System-on-Chip Design, Embedded Systems, Low-Power, FPGA, High-level Synthesis, Physical Design, and Testing. For the first time in this conference there is a separate track for embedded systems.

Progress in VLSI Design and Test
  • Language: en
  • Pages: 427

Progress in VLSI Design and Test

  • Type: Book
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  • Published: 2012-06-26
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  • Publisher: Springer

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

VLSI and Parallel Computing for Pattern Recognition and Artificial Intelligence
  • Language: en
  • Pages: 296

VLSI and Parallel Computing for Pattern Recognition and Artificial Intelligence

This book covers parallel algorithms and architectures and VLSI chips for a range of problems in image processing, computer vision, pattern recognition and artificial intelligence. The specific problems addressed include vision and image processing tasks, Fast Fourier Transforms, Hough Transforms, Discrete Cosine Transforms, image compression, polygon matching, template matching, pattern matching, fuzzy expert systems and image rotation. The collection of papers gives the reader a good introduction to the state-of-the-art, while for an expert this serves as a good reference and a source of some new contributions in this field. Contents:ENPASSANT: An Environment for Evaluating Massively Paral...

VLSI Design and Test
  • Language: en
  • Pages: 607

VLSI Design and Test

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

VLSI Design and Test
  • Language: en
  • Pages: 722

VLSI Design and Test

  • Type: Book
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  • Published: 2019-01-24
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  • Publisher: Springer

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

VLSI Design and Test
  • Language: en
  • Pages: 815

VLSI Design and Test

  • Type: Book
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  • Published: 2017-12-21
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  • Publisher: Springer

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Energy Efficient and Reliable Embedded Nanoscale SRAM Design
  • Language: en
  • Pages: 213

Energy Efficient and Reliable Embedded Nanoscale SRAM Design

  • Type: Book
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  • Published: 2023-11-30
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  • Publisher: CRC Press

This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and rel...

Design and Analysis of Spiral Inductors
  • Language: en
  • Pages: 116

Design and Analysis of Spiral Inductors

The book addresses the critical challenges faced by the ever-expanding wireless communication market and the increasing frequency of operation due to continuous innovation of high performance integrated passive devices. The challenges like low quality factor, design complexity, manufacturability, processing cost, etc., are studied with examples and specifics. Silicon on-chip inductor was first reported in 1990 by Nguyen and Meyer in a 0.8 μm silicon bipolar complementary metal oxide semiconductor technology (BiCMOS). Since then, there has been an enormous progress in the research on the performance trends, design and optimization, modeling, quality factor enhancement techniques, etc., of sp...