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Defect Recognition and Image Processing in Semiconductors 1997
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Photosynthesis, two centuries after its discovery by Joseph Priestley
The Second International Congress on Photosynthesis Research took place in Stresa, Italy during June 24-29, 1971; two centuries after the discovery of Photosynthesis by Joseph Priestley in 1771. This important anniversary was celebrated at the Congress by a learned account of Priestley's life and fundamental discoveries given by Professor Robin HILL, F. R. S. Professor HILL's lecture opens the first of the three volumes which contains the contributions presented at the Congress. The manuscripts have been distributed into three volumes. Volume I con tains contributions in the areas of primary reactions and electron transport; Volume II ion transport and photophosphorylation, and Volume III ca...
