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Handbook of Silicon Semiconductor Metrology
  • Language: en
  • Pages: 703

Handbook of Silicon Semiconductor Metrology

  • Type: Book
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  • Published: 2001-06-29
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  • Publisher: CRC Press

Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay

Optical and Electrical Properties of Nanoscale Materials
  • Language: en
  • Pages: 495

Optical and Electrical Properties of Nanoscale Materials

This book covers the optical and electrical properties of nanoscale materials with an emphasis on how new and unique material properties result from the special nature of their electronic band structure. Beginning with a review of the optical and solid state physics needed for understanding optical and electrical properties, the book then introduces the electronic band structure of solids and discusses the effect of spin orbit coupling on the valence band, which is critical for understanding the optical properties of most nanoscale materials. Excitonic effects and excitons are also presented along with their effect on optical absorption. 2D materials, such as graphene and transition metal di...

Semiconductor Characterization
  • Language: en
  • Pages: 760

Semiconductor Characterization

Market: Those in government, industry, and academia interested in state-of-the-art knowledge on semiconductor characterization for research, development, and manufacturing. Based on papers given at an International Nist Workshop in January 1995, Semiconductor Characterization covers the unique characterization requirements of both silicon IC development and manufacturing, and compound semiconductor materials, devices, and manufacturing. Additional sections discuss technology trends and future requirements for compound semiconductor applications. Also highlighted are recent developments in characterization, including in- situ, in-FAB, and off-line analysis methods. The book provides a concise, effective portrayal of industry needs and problems in the important specialty of metrology for semiconductor technology.

Journal of Research of the National Institute of Standards and Technology
  • Language: en
  • Pages: 490

Journal of Research of the National Institute of Standards and Technology

  • Type: Book
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  • Published: 1996
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  • Publisher: Unknown

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Handbook of Nanophysics
  • Language: en
  • Pages: 782

Handbook of Nanophysics

  • Type: Book
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  • Published: 2010-09-17
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  • Publisher: CRC Press

Many bottom-up and top-down techniques for nanomaterial and nanostructure generation have enabled the development of applications in nanoelectronics and nanophotonics. Handbook of Nanophysics: Nanoelectronics and Nanophotonics explores important recent applications of nanophysics in the areas of electronics and photonics. Each peer-reviewed c

Ellipsometry at the Nanoscale
  • Language: en
  • Pages: 740

Ellipsometry at the Nanoscale

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics...

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes
  • Language: en
  • Pages: 572

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes

.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.

Advances in Solid State Physics 48
  • Language: en
  • Pages: 390

Advances in Solid State Physics 48

The 2008 Spring Meeting of the Arbeitskreis Festkörperphysik was held in Berlin, Germany, between February 24 and February 29, 2008 in conjunction with the 72nd Annual Meeting of the Deutsche Physikalische Gesellschaft. The 2008 meeting was the largest physics meeting in Europe and among the largest physics meetings in the world in 2008.

Convergence of Knowledge, Technology and Society
  • Language: en
  • Pages: 558

Convergence of Knowledge, Technology and Society

This volume aims to document the most important worldwide accomplishments in converging knowledge and technology, including converging platforms, methods of convergence, societal implications, and governance in the last ten years. Convergence in knowledge, technology, and society is the accelerating, transformative interaction among seemingly distinct scientific disciplines, technologies, and communities to achieve mutual compatibility, synergism, and integration, and through this process to create added value for societal benefit. It is a movement that is recognized by scientists and thought leaders around the world as having the potential to provide far-reaching solutions to many of todayâ...