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MEMS Reliability
  • Language: en
  • Pages: 300

MEMS Reliability

The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.

Contamination-Free Manufacturing for Semiconductors and Other Precision Products
  • Language: en
  • Pages: 461

Contamination-Free Manufacturing for Semiconductors and Other Precision Products

  • Type: Book
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  • Published: 2018-10-08
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  • Publisher: CRC Press

Recognizing the need for improved control measures in the manufacturing process of highly sensitized semiconductor technology, this practical reference provides in-depth and advanced treatment on the origins, procedures, and disposal of a variety of contaminants. It uses contemporary examples based on the latest hardware and processing apparatus to illustrate previously unavailable results and insights along with experimental and theoretical developments. Ensures the proper methods necessary to meet the standards established in the 1997 National Technology Roadmap for Semiconductors (NTRS)! Summarizing up-to-date control practices in the industry, Contamination-Free Manufacturing for Semicon...

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
  • Language: en
  • Pages: 272

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

New Materials and Devices Enabling 5G Applications and Beyond
  • Language: en
  • Pages: 369

New Materials and Devices Enabling 5G Applications and Beyond

  • Type: Book
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  • Published: 2024-01-24
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  • Publisher: Elsevier

New Materials and Devices for 5G Applications and Beyond focuses on the materials, device architectures and enabling integration schemes for 5G applications and emerging technologies. It gives a comprehensive overview of the trade-offs, challenges and unique properties of novel upcoming technologies. Starting from the application side and its requirements, the book examines different technologies under consideration for the different functions, both more conventional to exploratory, and within this context the book provides guidance to the reader on how to possibly optimize the system for a particular application. This book aims at guiding the reader through the technologies required to enab...

MEMS Reliability for Critical Applications
  • Language: en
  • Pages: 162
Reliability, Testing, and Characterization of MEMS/MOEMS.
  • Language: en
  • Pages: 332

Reliability, Testing, and Characterization of MEMS/MOEMS.

  • Type: Book
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  • Published: 2001
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  • Publisher: Unknown

None

Materials and Device Characterization in Micromachining
  • Language: en
  • Pages: 220

Materials and Device Characterization in Micromachining

  • Type: Book
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  • Published: 2000
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  • Publisher: Unknown

None

American Book Publishing Record
  • Language: en
  • Pages: 746

American Book Publishing Record

  • Type: Book
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  • Published: 2007
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  • Publisher: Unknown

None

MEMS Reliability for Critical and Space Applications
  • Language: en
  • Pages: 190

MEMS Reliability for Critical and Space Applications

A selection of scientific papers on the reliability of microelectromechanical systems (MEMS) for critical and space applications.

Digest of Technical Papers
  • Language: en
  • Pages: 924

Digest of Technical Papers

  • Type: Book
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  • Published: 2001
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  • Publisher: Unknown

Conference held in alternate years with other conferences on solid-state sensors.