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Neutrons and Synchrotron Radiation in Engineering Materials Science
  • Language: en
  • Pages: 460

Neutrons and Synchrotron Radiation in Engineering Materials Science

Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Neutrons and Synchrotron Radiation in Engineering Materials Science
  • Language: en
  • Pages: 486

Neutrons and Synchrotron Radiation in Engineering Materials Science

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography....

Almanach
  • Language: de
  • Pages: 688

Almanach

  • Type: Book
  • -
  • Published: 2011
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  • Publisher: Unknown

Vols. for 1854-19 include section: Die feierliche Jahressitzung (called Die feierliche Sitzung, 1854-1914; Die statutenmässige Jahressitzung, 1915-21; published also separately, 1848-99)

Jahresbericht
  • Language: de
  • Pages: 302

Jahresbericht

  • Type: Book
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  • Published: 2009
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  • Publisher: Unknown

None

Thermische Mikroeigenspannungen in Stückverbunden
  • Language: de
  • Pages: 217

Thermische Mikroeigenspannungen in Stückverbunden

  • Type: Book
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  • Published: 1995
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  • Publisher: Unknown

None

Polymer Materials
  • Language: en
  • Pages: 743

Polymer Materials

Advanced reviews for Polymer Materials "Molecular modeling of polymers ... is a subject that cannot be found in any other [book] in any appreciable detail. ... [T]he detailed chapters on specific polymer systems is a great idea." — Gregory Odegard, Michigan Technological University "The polymer community needs a text book which can connect the macroscopic mechanics with mesoscopic and molecular aspects of polymer." — Liangbin Li, University of Science and Technology of China This book takes a unique, multi-scale approach to the mechanical properties of polymers, covering both the macroscopic and molecular levels unlike any other book on the market. Based on the authors’ extensive resea...

Introduction to Materials Chemistry
  • Language: en
  • Pages: 512

Introduction to Materials Chemistry

This textbook introduces the reader to the elementary chemistry on which materials science depends by discussing the different classes of materials and their applications. It shows the reader how different types of materials are produced, why they possess specific properties, and how they are used in technology. Each chapter contains study questions to enable discussions and consolidation of the acquired knowledge. The new edition of this textbook is completely revised and updated to reflect the significant expansion of the field of materials chemistry over the last years, covering now also topics such as graphene, nanotubes, light emitting diodes, extreme photolithography, biomedical materi...

Spectroscopic Ellipsometry
  • Language: en
  • Pages: 388

Spectroscopic Ellipsometry

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

Biology of the Sauropod Dinosaurs
  • Language: en
  • Pages: 369

Biology of the Sauropod Dinosaurs

Sauropods, those huge plant-eating dinosaurs, possessed bodies that seem to defy every natural law. What were these creatures like as living animals and how could they reach such uniquely gigantic sizes? A dedicated group of researchers in Germany in disciplines ranging from engineering and materials science to animal nutrition and paleontology went in search of the answers to these questions. Biology of the Sauropod Dinosaurs reports on the latest results from this seemingly disparate group of research fields and integrates them into a coherent theory regarding sauropod gigantism. Covering nutrition, physiology, growth, and skeletal structure and body plans, this volume presents the most up-to-date knowledge about the biology of these enormous dinosaurs.

Materials Characterization
  • Language: en
  • Pages: 384

Materials Characterization

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.