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Radiation Standards, Including Fallout
  • Language: en
  • Pages: 1072

Radiation Standards, Including Fallout

  • Type: Book
  • -
  • Published: 1962
  • -
  • Publisher: Unknown

Reviews and updates information on radiation standards including fallout, genetic consequences of radiation exposure, and role and function of Federal Radiation Council and private organizations in administering radiation standards. Includes, "Monitoring-Surveillance Activities in U.S.," by James G. Terrill, Jr., Dep Chief, Div of Radiological Health, HEW, June 5, 1962 (p. 179-237).

NBS Special Publication
  • Language: en
  • Pages: 464

NBS Special Publication

  • Type: Book
  • -
  • Published: 1968
  • -
  • Publisher: Unknown

None

Nuclear Standards for Chemistry and Technology
  • Language: en
  • Pages: 268

Nuclear Standards for Chemistry and Technology

  • Type: Book
  • -
  • Published: 1968
  • -
  • Publisher: Unknown

None

Hearings and Reports on Atomic Energy
  • Language: en
  • Pages: 1140

Hearings and Reports on Atomic Energy

  • Type: Book
  • -
  • Published: 1962
  • -
  • Publisher: Unknown

None

Hearings
  • Language: en
  • Pages: 1254

Hearings

  • Type: Book
  • -
  • Published: 1962
  • -
  • Publisher: Unknown

None

Radiation Standards, Including Fallout: Appendix [written statements
  • Language: en
  • Pages: 602

Radiation Standards, Including Fallout: Appendix [written statements

  • Type: Book
  • -
  • Published: 1962
  • -
  • Publisher: Unknown

Reviews and updates information on radiation standards including fallout, genetic consequences of radiation exposure, and role and function of Federal Radiation Council and private organizations in administering radiation standards. Includes, "Monitoring-Surveillance Activities in U.S.," by James G. Terrill, Jr., Dep Chief, Div of Radiological Health, HEW, June 5, 1962 (p. 179-237).

Methods of Measurement for Semiconductor Materials, Process Control, and Devices; Quarterly Report
  • Language: en
  • Pages: 60
Methods of Measurement for Semiconductor Materials, Process Control, and Devices
  • Language: en
  • Pages: 60

Methods of Measurement for Semiconductor Materials, Process Control, and Devices

  • Type: Book
  • -
  • Published: 1971
  • -
  • Publisher: Unknown

None