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Introduction to Magnetic Materials
Introduction to Magnetic Materials, 2nd Edition covers the basics of magnetic quantities, magnetic devices, and materials used in practice. While retaining much of the original, this revision now covers SQUID and alternating gradient magnetometers, magnetic force microscope, Kerr effect, amorphous alloys, rare-earth magnets, SI Units alongside cgs units, and other up-to-date topics. In addition, the authors have added an entirely new chapter on information materials. The text presents materials at the practical rather than theoretical level, allowing for a physical, quantitative, measurement-based understanding of magnetism among readers, be they professional engineers or graduate-level students.
Elements of X-ray Diffraction
This text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. No metallurgical data are given beyond that necessary to illustrate the diffraction methods involved.
X Ray Wavelengths
None
X-Ray Diffraction Crystallography
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises ...
Magnetism and Magnetic Materials
An essential textbook for graduate courses on magnetism and an important source of practical reference data.
X-Ray Diffraction
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Magnetic Materials
Magnetic Materials is an excellent introduction to the basics of magnetism, magnetic materials and their applications in modern device technologies. Retaining the concise style of the original, this edition has been thoroughly revised to address significant developments in the field, including the improved understanding of basic magnetic phenomena, new classes of materials, and changes to device paradigms. With homework problems, solutions to selected problems and a detailed list of references, Magnetic Materials continues to be the ideal book for a one-semester course and as a self-study guide for researchers new to the field. New to this edition: • Entirely new chapters on Exchange Bias Coupling, Multiferroic and Magnetoelectric Materials, Magnetic Insulators • Revised throughout, with substantial updates to the chapters on Magnetic Recording and Magnetic Semiconductors, incorporating the latest advances in the field • New example problems with worked solutions
Thin Film Analysis by X-Ray Scattering
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
