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Silicon
  • Language: en
  • Pages: 552

Silicon

With topics ranging from epitaxy through lattice defects and doping to quantum computation, this book provides a personalized survey of the development and use of silicon, the basis for the revolutionary changes in our lives sometimes called "The Silicon Age." Beginning with the very first developments more than 50 years ago, this reports on all aspects of silicon and silicon technology up to its use in exciting new technologies, including a glance at possible future developments.

Hydrogen in Semiconductors II
  • Language: en
  • Pages: 541

Hydrogen in Semiconductors II

Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The "Willardson and Beer" Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribut...

Identification of Defects in Semiconductors
  • Language: en
  • Pages: 376

Identification of Defects in Semiconductors

Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute t...

Point Defects in Semiconductors and Insulators
  • Language: en
  • Pages: 497

Point Defects in Semiconductors and Insulators

The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago. Since then a very active development has oc curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are us...

Diffusion and Defect Data
  • Language: en
  • Pages: 1032

Diffusion and Defect Data

  • Type: Book
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  • Published: 2002
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  • Publisher: Unknown

None

Early Stages of Oxygen Precipitation in Silicon
  • Language: en
  • Pages: 535

Early Stages of Oxygen Precipitation in Silicon

It was fOlllld as long ago as 1954 that heating oxygen rich silicon to around 450°C produced electrical active defects - the so called thermal donors. The inference was that the donors were created by some defect produced by the aggregation of oxygen. Since then, there has been an enor mous amount of work carried out to elucidate the detailed mechanism by which they, and other defects, are generated. This task has been made all the more relevant as silicon is one of the most important technological ma terials in everyday use and oxygen is its most common impurity. However, even after forty years, the details of the processes by which the donors and other defects are generated are still obsc...

Deep Centers in Semiconductors
  • Language: en
  • Pages: 952

Deep Centers in Semiconductors

  • Type: Book
  • -
  • Published: 1992-11-30
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  • Publisher: CRC Press

Examines several key semiconductor deep centers, all carefully chosen to illustrate a variety of essential concepts. A deep center is a lattice defect or impurity that causes very localized bound states and energies deep in the band gap. For each deep center chosen, a scientist instrumental in its development discusses the theoretical and experimental techniques used to understand that center. The second edition contains four new sections treating recent developments, including a chapter on hydrogen in crystalline semiconductors. Annotation copyright by Book News, Inc., Portland, OR

Shallow-level Centers In Semiconductors - Proceedings Of The 7th International Conference
  • Language: en
  • Pages: 554

Shallow-level Centers In Semiconductors - Proceedings Of The 7th International Conference

This book is devoted to the specific physical and chemical properties of centers in semiconductors with shallow energy levels and electronic distributions of an extended size. Reports are included on the most advanced experimental and theoretical methods for identifying and further characterizing these materials. Attention is given to such topics as shallow-level centers in host semiconductors of lower dimensionality, centers in wide-bandgap semiconductors, shallow excited states of centers with deep ground states, passivation of centers, and other aspects of impurity control during crystal growth and processing with its relevance to applications.

High Purity Silicon 10
  • Language: en
  • Pages: 370

High Purity Silicon 10

The issue of the 10th High Purity Silicon symposium provides an overview of the latest developments in the growth, characterization, devices processing, and application of high purity silicon in either bulk or epitaxial form. The emphasis is on the control and prevention of impurity incorporation, characterization and detection of defects and impurity states in high purity and high resistivity silicon for superior device performances. Device and circuit aspects related to the application of devices fabricated on high resistivity silicon wafers will also be addressed. Special attention will be given to alternative and high-mobility substrates and their material and device aspects.

Foundations of Modern EPR
  • Language: en
  • Pages: 832

Foundations of Modern EPR

Since its inception 50 years ago, electron paramagnetic resonance (EPR, also called ESR or EMR) has become a major tool in diverse fields ranging from biology and chemistry to solid state physics and materials science. This important book includes personal descriptions of early experiments by pioneers who laid the foundations for the field, perspectives on the state of the art, and glimpses of future opportunities. It presents a broad view of the foundations of EPR and its applications, and will therefore appeal to scientists in many fields. Even the expert will find here history not previously recorded and provocative views of future directions. Contents: Historical IntroductionTransition M...