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Uncooled Infrared Imaging Arrays and Systems
This is the first book to describe an emerging but already growing technology of thermal imaging based on uncooled infrared imaging arrays and systems, which are the most exciting new developments in infrared technology today. This technology is of great importance to developers and users of thermal images for military and commercial applications. The chapters, prepared by world leaders in the technology, describe not only the mainstream efforts, but also exciting new approaches and fundamental limits applicable to all. - Unified approach to technology development based on fundamental limits - Individual chapters written by world leaders in each technology - Novel potential approaches, allowing for the reduction of costs, described in detail - Descriptive and analytical - Provides details of the mainstream approaches--resistive bolometric, pyroelectric/field enhanced pyroelectric, thermoelectric - Provides insight into a unified approach to development of all types of thermal imaging arrays Features state-of-the-art and selected new developments
Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization
Defects in ion-implanted semiconductors are important and will likely gain increased importance as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects whose origin and annealing characteristics will need to be addressed. Publications in this field mainly focus on the effects of ion implantation on the material and the modification in the implanted layer after high temperature annealing. The editors of this volume and Volume 45 focus on the physics of the annealing kinetics of the damaged layer. An overview of characterization tehniques and a critical comparison of the information on annealing kinetics is also presented. - Provides basic knowledge of ion implantation-induced defects - Focuses on physical mechanisms of defect annealing - Utilizes electrical, physical, and optical characterization tools for processed semiconductors - Provides the basis for understanding the problems caused by the defects generated by implantation and the means for their characterization and elimination
Germanium Silicon: Physics and Materials
Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The "Willardson and Beer" Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribut...
Identification of Defects in Semiconductors
Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute t...
High Pressure Semiconductor Physics I
Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The "Willardson and Beer" Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribut...
Physics, Chemistry and Technology of Solid State Gas Sensor Devices
Research and development of solid state gas sensor devices began in the 1950s with several uncoordinated independent efforts. The number and pace of these investigations later accelerated in response to increasing pressure placed on the environment and public health by industrial activities. Since 1970, several thousand articles have been written on the subject, and laboratories around the globe have introduced novel methodologies and devices to address needs associated with particular technological developments. Despite the rapid development of this important new technology, very little has been done to review and coordinate data related to sensor science and technology itself. Physics, Che...
Laser-Enhanced Ionization Spectroscopy
Laser-enhanced ionization (LEI) is a type of optical spectrometrythat employs photoexcitation to ionize atoms selectively. Over thepast two decades, this method--originally known as the optogalvaniceffect--has been the object of extensive worldwide research and thesubject of numerous papers and published articles. Until now,however, no single volume has presented this wealth of theory anddata in a cohesive and accessible form. Laser-Enhanced Ionization Spectrometry fills this gap in theliterature. It synthesizes vast amounts of information previouslyavailable only through scattered research papers and covers everyaspect of the technology, from underlying principles and theory tomethodology a...
Limits of Detection in Chemical Analysis
Details methods for computing valid limits of detection. Clearly explains analytical detection limit theory, thereby mitigating incorrect detection limit concepts, methodologies and results Extensive use of computer simulations that are freely available to readers Curated short-list of important references for limits of detection Videos, screencasts, and animations are provided at an associated website, to enhance understanding Illustrated, with many detailed examples and cogent explanations
Fourier Transform Infrared Spectrometry
A bestselling classic reference, now expanded and updated to cover the latest instrumentation, methods, and applications The Second Edition of Fourier Transform Infrared Spectrometry brings this core reference up to date on the uses of FT-IR spectrometers today. The book starts with an in-depth description of the theory and current instrumentation of FT-IR spectrometry, with full chapters devoted to signal-to-noise ratio and photometric accuracy. Many diverse types of sampling techniques and data processing routines, most of which can be performed on even the less expensive instruments, are then described. Extensively updated, the Second Edition: * Discusses improvements in optical component...
Identification of Microorganisms by Mass Spectrometry
A multidisciplinary approach to understanding the fundamentals of mass spectrometry for bacterial analysis From chemotaxonomy to characterization of targeted proteins, Identification of Microorganisms by Mass Spectrometry provides an overview of both well-established and cutting-edge mass spectrometry techniques for identifying microorganisms. A vital tool for microbiologists, health professionals, and analytical chemists, the text is designed to help scientists select the most effective techniques for use in biomedical, biochemical, pharmaceutical, and bioterror defense applications. Since microbiological applications of mass spectrometry require a basic understanding of both microbiology a...
