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Scientific problems have an internal 'beauty', called, referred to, precisely speaking, as their 'symmetry'. The symmetry arises, often, from the fact that the scientific problem refers to an object (a molecule, a crystal) and the object itself has some 'symmetry' elements, but in more abstract situations, such as those arising in particle physics and quantum technologies, symmetry is often the only known (and relevant!) fact about the problem. The scope of these Lecture Notes is to educate how to recognize the symmetry of a scientific problem and how to use symmetry to understand, manipulate and, finally, solve it. The principle guiding these Lecture Notes is that 'learning by doing' is the...
A comprehensive and pedagogical text on nonequilibrium statistical physics, covering topics from random walks to pattern formation.
I was invited to join the Organizing Committee of the First International Conference on Complex Sciences: Theory and Applications (Complex 2009) as its ninth member. At that moment, eight distinguished colleagues, General Co-chairs Eugene Stanley and Gaoxi Xiao, Technical Co-chairs J·nos Kertész and Bing-Hong Wang, Local Co-chairs Hengshan Wang and Hong-An Che, Publicity Team Shi Xiao and Yubo Wang, had spent hundreds of hours pushing the conference half way to its birth. Ever since then, I have been amazed to see hundreds of papers flooding in, reviewed and commented on by the TPC members. Finally, more than 200 contributions were - lected for the proceedings currently in your hands. They...
Low beam energies have been implemented in a simplified SEM technique; where the electron source, remote in standard SEMs, is brought within tens of nanometers to the object. This method, known as the "near field emission scanning electron microscopy" (NFESEM), is capable of imaging conducting surfaces with nanometer resolution using beam energies less than 60 eV. The terminology "near" refers to the locality of the field-emitted electron source; which is to distinguish itself from the "remote" field emission gun sources used in standard SEMs. The main aim of this instrument is the realization of some kind of surface topography image due to the exposure of a primary beam of electrons, as it ...
The main theme of this book is the exploration the underlying physical laws that permit the fabrication of nanometer-scale structures. As researchers attempt to fabricate nanometer-scale structures which do not exist per se, they must still employ the natural laws to fabricate them through processes such as self-assembly. This book will find service both as a reference work for researchers and as a comprehensive didactical text for graduate students.
Oaxaca, Mexico, was the place chosen by a large international group of scientists to meet and discuss on the recent advances on the understanding of the physical prop- ties of low dimensional systems; one of the most active fields of research in condensed matter in the last years. The International Symposium on the Physics of Low Dim- sions took place in January 16-20, 2000. The group of scientists converging into the historical city of Oaxaca, in the state of the same name, had come from Argentina, Chile, Venezuela, several places in Mexico, Canada, U. S. A. , England, France, Italy, Germany, Russia, and Switzerland. The presentations at the workshop provided sta- of-art reviews of many of ...
Competing interactions on different length scales are responsible for the spontaneous formation of modulated phases - patterns - in many physical and chemical systems. In this thesis we investigate the magnetic domain patterns of atomically-thin iron films on the copper (001)-surface in the two-parameter space spanned by temperature and the applied magnetic field. Upon heating the sample in a constant applied field, we observe a transition from the uniform, saturated state to circular domains in a homogeneous background, the bubble state. This transition breaks the translational symmetry of the domain pattern and a second transition, leading from bubbles to regular stripes of alternating mag...
Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing