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Fundamentals of Terahertz Devices and Applications
  • Language: en
  • Pages: 580

Fundamentals of Terahertz Devices and Applications

An authoritative and comprehensive guide to the devices and applications of Terahertz technology Terahertz (THz) technology relates to applications that span in frequency from a few hundred GHz to more than 1000 GHz. Fundamentals of Terahertz Devices and Applications offers a comprehensive review of the devices and applications of Terahertz technology. With contributions from a range of experts on the topic, this book contains in a single volume an inclusive review of THz devices for signal generation, detection and treatment. Fundamentals of Terahertz Devices and Applications offers an exploration and addresses key categories and aspects of Terahertz Technology such as: sources, detectors, ...

RF Technologies for Low Power Wireless Communications
  • Language: en
  • Pages: 482

RF Technologies for Low Power Wireless Communications

A survey of microwave technology tailored for professionals in wireless communications RF Technologies for Low Power Wireless Communications updates recent developments in wireless communications from a hardware design standpoint and offers specialized coverage of microwave technology with a focus on the low power wireless units required in modern wireless systems. It explores results of recent research that focused on a holistic, integrated approach to the topics of materials, devices, circuits, modulation, and architectures rather than the more traditional approach of research into isolated topical areas. Twelve chapters deal with various fundamental research aspects of low power wireless ...

Gallium Arsenide and Related Compounds 1991, Proceedings of the Eighteenth INT Symposium, 9-12 September 1991, Seattle, USA
  • Language: en
  • Pages: 680

Gallium Arsenide and Related Compounds 1991, Proceedings of the Eighteenth INT Symposium, 9-12 September 1991, Seattle, USA

  • Type: Book
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  • Published: 2020-11-25
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  • Publisher: CRC Press

Gallium Arsenide and Related Compounds 1991emphasizes current results on the materials, characterization, and device aspects of a broad range of semiconductor materials, particularly the III-V compounds and alloys. The book is a valuable reference for researchers in physics, materials science, and electronics and electrical engineering who work on III-V compounds.

Adventures of a Materials Scientist
  • Language: en
  • Pages: 339

Adventures of a Materials Scientist

  • Type: Book
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  • Published: 2018-01-05
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  • Publisher: FriesenPress

This book describes the professional experiences of a materials scientist, as an academic and a consultant. From research laboratories and university classrooms, to the engineering departments of major corporations, to large law firms and the courtrooms where the cases of their clients are being tried, Dr. Pehlke demonstrates his deep knowledge of the field of materials. Dr. Pehlke’s consulting activities, described as "from steelmaking to suture needles," present a vast array of materials challenges, including medical devices such as the Bjork-Shiley heart valve, materials process design, steel plant engineering and the prevention of dangerous explosions. The variety of consulting assignments and Dr. Pehlke’s often pivotal involvement make a wonderful read for those interested in materials science and engineering consulting.

Defect Recognition and Image Processing in Semiconductors 1997
  • Language: en
  • Pages: 552

Defect Recognition and Image Processing in Semiconductors 1997

  • Type: Book
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  • Published: 2017-11-22
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  • Publisher: Routledge

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

D.R.D.A. Reporter
  • Language: en
  • Pages: 270

D.R.D.A. Reporter

None

College of Engineering
  • Language: en
  • Pages: 502

College of Engineering

None

Proceedings of the Board of Regents
  • Language: en
  • Pages: 380

Proceedings of the Board of Regents

  • Type: Book
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  • Published: 1988
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  • Publisher: Unknown

None

University of Michigan Official Publication
  • Language: en
  • Pages: 164

University of Michigan Official Publication

Each number is the catalogue of a specific school or college of the University.

Regents' Proceedings
  • Language: en
  • Pages: 380

Regents' Proceedings

  • Type: Book
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  • Published: 1988
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  • Publisher: Unknown

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