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Exploring Scanning Probe Microscopy with MATHEMATICA
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample inter...
Modern Introduction to Surface Plasmons
This book introduces graduate students in physics, optics, materials science and electrical engineering to surface plasmons, and applications of surface plasmon physics.
Scanning Force Microscopy
This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
Optical Bistability III
This is a collection of papers presented at the Topical Meeting on Optical BistabiJity (OB3) held December 2-4,1985 in Tucson, Arizona. The increase in attendance to almost 200 shows that interest continues to grow in the sub ject of optical bistability (OB) and its wider implications both in application to "optical digital computing" and to basic physics, notably instabilities and spatial effects. The maturing of the field is evidenced by the fact that the number of experimental papers has caught up with the number of theoretical ones. These trends were already apparent in OB2 and the 1984 Royal Society Meeting on Optical Bistabilty, Dynamical Nonlinearity and Photonic Logic. Progress in ex...
Scanning Force Microscopy
Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
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Kirk-Othmer Concise Encyclopedia of Chemical Technology, 2 Volume Set
This is an easily-accessible two-volume encyclopedia summarizing all the articles in the main volumes Kirk-Othmer Encyclopedia of Chemical Technology, Fifth Edition organized alphabetically. Written by prominent scholars from industry, academia, and research institutions, the Encyclopedia presents a wide scope of articles on chemical substances, properties, manufacturing, and uses; on industrial processes, unit operations in chemical engineering; and on fundamentals and scientific subjects related to the field.
Introduction to Nanoscience and Nanotechnology
Introduction to Nanoscience and Nanotechnology explains nanotechnology to an audience that does not necessarily have a scientific background. It covers all aspects, including the new areas of biomedical applications and the use of nanotechnology to probe the "quantum vacuum." After discussing the present state of the art in nanotechnology, the book makes estimates of where these technologies are going and what will be possible in the future.
