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Near-field Optics
Near-field optics, dealing with the interaction between optical field and matter in the nanometric region, has become an interdisciplinary field spaning physics, chemistry, materials science, electrical engineering and high density data storage. This book reflects the recent status of this rapidly growing field. It discusses the basic theories, instrumentation, novel probes, theoretical simulations, and the application of near-field optics to the fields of condensed matter physics, new materials, information storage, atom photonics, etc. It provides an overview of the research on near-field optics in the 1990s.
Photons and Local Probes
This volume contains papers presented at the NATO Advanced Research Workshop (ARW) on Photons and Local Probes. The workshop had two predecessors. The first was the NATO ARW on Near Field Optics, held in October 1992 at Arc et Senans and was organized by Daniel Courjon and Dieter Pohl. The other predecessor was a workshop on Photons and Scanning Probe Microscopies held at the University of Konstanz in July 1992. The workshop on Photons and Local Probes was held at the Loechnerhaus on the Reichenau Island at the Lake of Constance, from September 11 to 17, 1994. The Reichenau Island was an important place in Europe in the middle age. Even the tomb of one of the carolingian emperors, Charles the Fat, is located there. At this workshop more than 60 scientists from Europe and the United States met to communicate their latest results in the field of local probes in combination with optical techniques. In eight sessions 31 talks as well as 9 posters were presented. Among those 31 publications were submitted for publication in the NATO proceedings. They were accepted after a strict, but constructive refereeing process.
Near Field Optics and Nanoscopy
This book contains the most recent information on optical nanoscopy. Far-Field and Near-Field properties on e.m. waves are presented which illustrate how optical images can be obtained from sub-micron objects. Scanning Probe techniques and computer processing are covered here. An explanation is given on how propagating photons or evanescent waves can behave over distances shorter than the wavelength, taking into account the presence of small objects. Quantum tunneling of photons is explained comparatively with the electron mechanism. Technical details are given on photon tunneling microscopes. Typical results already obtained with these techniques are also described.
Nano-optics and Near-field Optical Microscopy
"This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.
Scanning Probe Microscopy
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
Point and Extended Defects in Semiconductors
The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. The book do...
Diffraction and Spectroscopic Methods in Electrochemistry
This ninth volume in the series concentrates on in situ spectroscopic methods and combines a balanced mixture of theory and applications, making it highly readable for chemists and physicists, as well as for materials scientists and engineers. As with the previous volumes, all the chapters continue the high standards of this series, containing numerous references to further reading and the original literature, for easy access to this new field. The editors have succeeded in selecting highly topical areas of research and in presenting authors who are leaders in their fields, covering such diverse topics as diffraction studies of the electrode-solution interface, thin organic films at electrode surfaces, linear and non-linear spectroscopy as well as sum frequency generation studies of the electrified solid-solution interface, plus quantitative SNIFTIRS and PM-IRRAS. Special attention is paid to recent advances and developments, which are critically and thoroughly discussed. The result is a compelling set of reviews, serving equally well as an excellent and up-to-date source of information for experienced researchers in the field, as well as as an introduction for newcomers.
Phonon Scattering in Solids
The Second International Conference on Phonon Scattering in Solids was held at the University of Nottingham from August 27th - 30th 1975. It was attended by 192 delegates from 24 countries who were accompanied by 43 members of their families. Eleven invited papers were read and 96 contributed papers; the contributed papers were in two parallel sessions. The Conference included the topics of the two International Conferences held in France in 1972, in Paris and at Ste Maxime. The Conference brought together workers concerned with many aspects of phonon scattering in solids and liquid helium. Some of the work reported were studies of the intrinsic properties of diel ectric materials such as th...
Physical Methods of Chemistry, Investigations of Surfaces and Interfaces
Each volume of this series heralds profound changes in both the perception and practice of chemistry. This edition presents the state of the art of all important methods of instrumental chemical analysis, measurement and control. Contributions offer introductions together with sufficient detail to give a clear understanding of basic theory and apparatus involved and an appreciation of the value, potential and limitations of the respective techniques. The emphasis of the subjects treated is on method rather than results, thus aiding the investigator in applying the techniques successfully in the laboratory.
Scanning Probe Microscopy
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
