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Proceedings of the 12th International Conference on Measurement and Quality Control - Cyber Physical Issue
This book gathers the proceedings of the 12th International Conference on Measurement and Quality Control – Cyber Physical Issues (IMEKO TC 14 2019), held in Belgrade, Serbia, on 4–7 June 2019. The event marks the latest in a series of high-level conferences that bring together experts from academia and industry to exchange knowledge, ideas, experiences, research findings, and information in the field of measurement of geometrical quantities. The book addresses a wide range of topics, including: 3D measurement of GPS characteristics, measurement of gears and threads, measurement of roughness, micro- and nano-metrology, laser metrology for precision measurements, cyber physical metrology, optical measurement techniques, industrial computed tomography, multisensor techniques, intelligent measurement systems, evaluating measurement uncertainty, dimensional management in industry, product quality assurance methods, and big data analytics. By providing updates on key issues and highlighting recent advances in measurement and quality control, the book supports the transfer of vital knowledge to the next generation of academics and practitioners.
Nanoscale Calibration Standards and Methods
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bund...
Interdisciplinary Applications of Kinematics
This is the proceedings of the Third Conference on Interdisciplinary Applications of Kinematics (IAK 2018) held in Lima, Peru, March 5–7, 2018. The conference brought together scientists from several research fields, such as computational kinematics, multibody systems, industrial machines, robotics, biomechanics, mechatronics, computational chemistry, and vibration analysis, and embraced all key aspects of kinematics, namely, theoretical methods, modeling, optimization, experimental validation, industrial applications, and design. Kinematics is an exciting area of computational mechanics and plays a central role in a great variety of fields and industrial applications nowadays. Apart from research in pure kinematics, the field deals with problems of practical relevance that need to be solved in an interdisciplinary manner in order for new technologies to develop. The results presented in this book should be of interest for practicing and research engineers as well as Ph.D. students from the fields of mechanical and electrical engineering, computer science, and computer graphics.
Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry
This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 μm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach.
Fringe 2009
21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus...
Fringe 2005
In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial applications of optical metrology. However, such a workshop must take place in a dynamic environment. The- fore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 new prin- ples of optical shape measurement, setup calibration, phase unwr- ping and nondestructive testing were the focus of discussion, while in 1997 new approaches in mu...
POF Simulation beyond Data Transmission
This book is a compilation of the contributions for the 3rd International POF Modelling Workshop 2015. It covers the modelling of the light transmission in the POF in the context of the environment for sensing and other applications.
Progress on Advanced Manufacture for Micro/nano Technology 2005
This is a time of newly emerging research topics in manufacturing technologies such as MEMS/Nano-Technology, Photo-Electric Devices, Precision Mechanical, Semiconductor and Optico-Mechatronic Manufacturing Technologies as well as Advanced Manufacturing and Automation Technology. The objective of this book is to provide a timely opportunity for the manufacturing community to present its newest research results, exchange ideas and become familiar with new trends and directions in the above manufacturing fields.
