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X-ray Characterization of Materials
  • Language: en
  • Pages: 277

X-ray Characterization of Materials

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials chara...

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
  • Language: en
  • Pages: 415

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal ...

Microbeam Analysis in Biology
  • Language: en
  • Pages: 695

Microbeam Analysis in Biology

  • Type: Book
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  • Published: 2012-12-02
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  • Publisher: Elsevier

Microbeam Analysis in Biology contains the proceedings of a workshop on Biological X-Ray Microanalysis by Electron Beam Excitation, held in Boston, Massachusetts on August 25-26, 1977. This book focuses on the principles, techniques, and biological use of electron probe microanalysis, energy-loss spectroscopy, and ion probe microanalysis. This text reflects the emphasis of the workshop on presenting the principles of analysis, the optimization of operating conditions, the description of successful techniques for sample preparation and quantitation, the illustration of problems and pitfalls, and the direction of microbeam analysis in biology.

Scanning Electron Microscopy and X-Ray Microanalysis
  • Language: en
  • Pages: 708

Scanning Electron Microscopy and X-Ray Microanalysis

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Accuracy in Trace Analysis
  • Language: en
  • Pages: 662

Accuracy in Trace Analysis

  • Type: Book
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  • Published: 1976
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  • Publisher: Unknown

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The Coming of Materials Science
  • Language: en
  • Pages: 591

The Coming of Materials Science

  • Type: Book
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  • Published: 2001-03-16
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  • Publisher: Elsevier

The Coming of Materials Science both covers the discipline of materials science, and draws an impressionistic map of the present state of the subject.The first chapter examines the emergence of the materials science concept, in both academe and industry. The second and third chapters delve back into the prehistory of materials science, examining the growth of such concepts as atoms, crystals and thermodynamics, and also examine the evolution of a number of neighbouring disciplines, to see what helpful parallels might emerge. The book contains numerous literature references. Many refer to the earliest key papers and books, while others are to sources, often books, offering a view of the prese...

Official Gazette of the United States Patent Office
  • Language: en
  • Pages: 2814

Official Gazette of the United States Patent Office

  • Type: Book
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  • Published: 1970
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  • Publisher: Unknown

None

Concise Encyclopedia of Semiconducting Materials & Related Technologies
  • Language: en
  • Pages: 607

Concise Encyclopedia of Semiconducting Materials & Related Technologies

  • Type: Book
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  • Published: 2013-10-22
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  • Publisher: Elsevier

The development of electronic materials and particularly advances in semiconductor technology have played a central role in the electronics revolution by allowing the production of increasingly cheap and powerful computing equipment and advanced telecommunications devices. This Concise Encyclopedia, which incorporates relevant articles from the acclaimed Encyclopedia of Materials Science and Engineering as well as newly commissioned articles, emphasizes the materials aspects of semiconductors and the technologies important in solid-state electronics. Growth of bulk crystals and epitaxial layers are discussed in the volume and coverage is included of defects and their effects on device behavi...

An Introduction to X-Ray Physics, Optics, and Applications
  • Language: en
  • Pages: 366

An Introduction to X-Ray Physics, Optics, and Applications

In this book, Carolyn A. MacDonald provides a comprehensive introduction to the physics of a wide range of x-ray applications, optics, and analysis tools. Theory is applied to practical considerations of optics and applications ranging from astronomy to medical imaging and materials analysis. Emphasizing common physical concepts that underpin diverse phenomena and applications of x-ray physics, the book opens with a look at nuclear medicine, motivating further investigations into scattering, detection, and noise statistics. The second section explores topics in x-ray generation, including characteristic emission, x-ray fluorescence analysis, bremsstrahlung emission, and synchrotron and laser...

Accuracy in Trace Analysis
  • Language: en
  • Pages: 666

Accuracy in Trace Analysis

  • Type: Book
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  • Published: 1976
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  • Publisher: Unknown

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