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Field Emission Scanning Electron Microscopy
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Phase-Contrast and Dark-Field Imaging
This book is a printed edition of the Special Issue "Phase-Contrast and Dark-Field Imaging" that was published in J. Imaging
Proceedings: Microscopy and Microanalysis 2002: Volume 8
This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and Microanalysis 2002 meeting held in Québec City, Québec, Canada on August 4-9, 2002. The Proceedings consists of both a printed volume containing the extended abstracts of all invited papers as well as a searchable CD-ROM containing the extended abstracts of all papers presented at the meeting --whether invited or submitted, platform or poster.
ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Statistical Methods for Materials Science
Data analytics has become an integral part of materials science. This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling. Additionally, the analysis and applications section addresses compressed sensing methods, stochastic models, extreme estimation, and approaches to pattern detection.
Listening through the Noise
Contemporary electronic music has splintered into numerous genres and subgenres, all of which share a concern with whether sound, in itself, bears meaning. Listening through the Noise considers how the experience of listening to electronic music constitutes a departure from the expectations that have long governed music listening in the West.
Billboard
In its 114th year, Billboard remains the world's premier weekly music publication and a diverse digital, events, brand, content and data licensing platform. Billboard publishes the most trusted charts and offers unrivaled reporting about the latest music, video, gaming, media, digital and mobile entertainment issues and trends.
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