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The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.
This book features selected works presented in the 28th National Conference on Condensed Matter Physics, “Condensed Matter Days (CMDAYS) 2020”, which was held from December 11th to 13th December 2020. The conference brought together seasoned experts and upcoming researchers from all over India to share their research and ideas in the field of condensed matter physics. This book is a glimpse into the works and ideas that were discussed and presented at the conference. It includes works on diverse fields from nanomaterials to fuel cells, photocatalysis to ferromagnetism, application studies to fundamental studies.
This book presents selected peer-reviewed contributions from the 2020 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2020 (26–29 March 2021, Kitakyushu, Japan), focusing on processing techniques, physics, mechanics, and applications of advanced materials. The book describes a broad spectrum of promising nanostructures, crystal structures, materials, and composites with unique properties. It presents nanotechnological design approaches, environmental-friendly processing techniques, and physicochemical as well as mechanical studies of advanced materials. The selected contributions describe recent progress in computational materials science methods and algorithms (in particular, finite-element and finite-difference modelling) applied to various technological, mechanical, and physical problems. The presented results are important for ongoing efforts concerning the theory, modelling, and testing of advanced materials. Other results are devoted to promising devices with higher accuracy, increased longevity, and greater potential to work effectively under critical temperatures, high pressure, and in aggressive environments.
These proceedings cover developments in imaging, diffraction and spectroscopy in the electron microscope, together complementary and competing techniques such as scanning optical and scanning stylus microscopies. A valuable reference source for researchers involved in the use of electron microscopy in physics, materials science and chemistry.
This book presents peer-reviewed articles from the 1st International Conference on Trends in Modern Physics (TiMP 2021) held at Assam Don Bosco University in Guwahati, India, between February 26 and 27, 2021. This conference was the 3rd in a series of annual conferences of the Department of Physics, ADBU, with the 1st and 2nd being national conferences. The conference was jointly organized by the Department of Physics, ADBU, and the Indian Association of Physics Teachers (IAPT) to promote greater synergy between thematic areas of astrophysics and cosmology, plasma physics, material and nanophysics, nuclear physics, and particle physics