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Dependable Computing - EDDC-3
The idea of creating the European Dependable Computing Conference (EDCC) was born at the moment when the Iron Curtain fell. A group of enthusiasts, who were pre viously involved in research and teaching in the ?eld of fault tolerant computing in different European countries, agreed that there is no longer any point in keeping pre viously independent activities apart and created a steering committee which took the responsibility for preparing the EDCC calendar and appointing the chairs for the in dividual conferences. There is no single European or global professional organization that took over the responsibility for this conference, but there are three national in terest groups that sent de...
Dependable Computing EDCC-4
It was with great pleasure that, on behalf of the entire organizing committee, I welcomed participants to EDCC-4, the Fourth European Dependable Computing Conference, held for the ?rst time in France. The fourth issue of EDCC carried on the traditions established bythe previous conferences in this series: EDCC-1 was held in Berlin (Germany) in October 1994, EDCC-2 in Taormina (Italy) in October 1996, and EDCC-3 in Prague (Czech Republic) in September 1999. EDCC evolved from a merger of tow other conference series at the moment when the Iron Curtain fell. One of these, known as the ”International Conf- ence on Fault-Tolerant Computing Systems”, was organized during the period 1982–1991,...
Kybernetika
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Annales
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AICA
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FTCS-23
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International Workshop on Electronic Design, Test and Applications
Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
