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High-Resolution Electron Microscopy
This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Advanced Transmission Electron Microscopy
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Electron Microdiffraction
Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State Universi...
Spitfire Pilot
Fighter pilot Lou Spence's story is one of bravery, leadership and love. Author John Spence draws on his father's wartime diaries, which he addressed to his young wife back in Perth. During World War 2, Lou Spence few in the Middle East against Rommel's forces, then defended Australia, flying spitfires against the Japanese. A courageous pilot, he went on to lead the RAAF 77 Squadron of Mustangs in the Korean War. A replica of Lou Spence's Spitfire is in the Darwin Aviation Museum.
Science of Microscopy
This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Springer Handbook of Microscopy
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical micr...
Lightspeed
This is the human story and adventures of the great scientists who measured the speed of light -- which takes eight minutes to get here from the sun, so that when we look at the stars we are looking back in time. The book narrates how, since the ancient Greeks, scientists from Faraday, Maxwell, Fizeau and Michelson struggled to understand how light can travel through the vacuum of outer space, unless it is filled with a ghostly invisible vortex Aether foam. Thereader moves from Galileo's observations of the eclipses of Jupiter's moon for navigation, to Einstein's theories and his equation E = mc2, and all the quantum weirdness which followed. Space probes,the Transit of Venus expeditions, the discovery of radio, optics and satellite navigation, and the amazing scientific instruments built to detect the Aether wind are described.
Experimental High-resolution Electron Microscopy
The new edition of this highly practical microscopy guide covers a wider range of applications and includes a new chapter on associated techniques along with new material on high-resolution images of periodic structures.
Electron Energy-Loss Spectroscopy in the Electron Microscope
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
