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Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
  • Language: en
  • Pages: 526

Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography g...

Atomic Scale Dynamics at Surfaces
  • Language: en
  • Pages: 647

Atomic Scale Dynamics at Surfaces

  • Type: Book
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  • Published: 2018-12-28
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  • Publisher: Springer

Experimental advances in helium atom scattering spectroscopy over the last forty years have allowed the measurement of surface phonon dispersion curves of more than 200 different crystal surfaces and overlayers of insulators, semiconductors and metals. The first part of the book presents, at a tutorial level, the fundamental concepts and methods in surface lattice dynamics, and the theory of atom-surface interaction and inelastic scattering in their various approximations, up to the recent electron-phonon theory of helium atom scattering from conducting surfaces. The second part of the book, after introducing the experimentalist to He-atom spectrometers and the rich phenomenology of helium a...

Electron Scattering and Related Spectroscopies
  • Language: en
  • Pages: 430

Electron Scattering and Related Spectroscopies

The main purpose of this book is to provide an overview of all phenomena which can be categorized under the general label of ?electron scattering?, and to give a comprehensive description of all spectroscopical techniques related to electron scattering phenomena. Various classes of events are examined (electron in-electron out, photon in-electron out, electron in-two electron out, electron diffraction), together with the corresponding experimental techniques. A description of the underlying physics of various electron scattering phenomena is provided. For each spectroscopy, the general principles, the main fields of application, and some selected representative cases are discussed. The use of relatively low-cost electron sources is emphasized with respect to photon sources. The book is directed to PhD students and researchers not necessarily yet expert in the field.

Electronic Structure and Properties
  • Language: en
  • Pages: 461

Electronic Structure and Properties

  • Type: Book
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  • Published: 2013-10-22
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  • Publisher: Elsevier

Treatise on Materials Science and Technology, Volume 21: Electronic Structure and Properties covers the developments in electron theory and electron spectroscopies. The book discusses the electronic structure of perfect and defective solids; the photoelectron spectroscopy as an electronic structure probe; and the electron-phonon interaction. The text describes the elastic properties of transition metals; the electrical resistivity of metals; as well as the electronic structure of point defects in metals. Metallurgists, materials scientists, materials engineers, and students involved in the related fields will find the book useful.

Solid State Batteries: Materials Design and Optimization
  • Language: en
  • Pages: 577

Solid State Batteries: Materials Design and Optimization

The field of solid state ionics is multidisciplinary in nature. Chemists, physicists, electrochimists, and engineers all are involved in the research and development of materials, techniques, and theoretical approaches. This science is one of the great triumphs of the second part of the 20th century. For nearly a century, development of materials for solid-state ionic technology has been restricted. During the last two decades there have been remarkable advances: more materials were discovered, modem technologies were used for characterization and optimization of ionic conduction in solids, trial and error approaches were deserted for defined predictions. During the same period fundamental t...

The Electronic Structure of Complex Systems
  • Language: en
  • Pages: 807

The Electronic Structure of Complex Systems

We present here the transcripts of lectures and talks which were delivered at the NATO ADVANCED STUDY INSTITUTE "Electronic Structure of Complex Systems" held at the State University of Ghent, Belgium during the period July 12-23, 1982. The aim of these lectures was to highlight some of the current progress in our understanding of the electronic structure of com plex systems. A massive leap forward is obtained in bandstructure calculations with the advent of linear methods. The bandtheory also profitted tremendously from the recent developments in the density functional theories for the properties of the interacting electron gas in the presence of an external field of ions. The means of per ...

Basic Properties of Semiconductors
  • Language: en
  • Pages: 1219

Basic Properties of Semiconductors

  • Type: Book
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  • Published: 2016-04-19
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  • Publisher: Elsevier

Since Volume 1 was published in 1982, the centres of interest in the basic physics of semiconductors have shifted. Volume 1 was called Band Theory and Transport Properties in the first edition, but the subject has broadened to such an extent that Basic Properties is now a more suitable title. Seven chapters have been rewritten by the original authors. However, twelve chapters are essentially new, with the bulk of this work being devoted to important current topics which give this volume an almost encyclopaedic form. The first three chapters discuss various aspects of modern band theory and the next two analyze impurities in semiconductors. Then follow chapters on semiconductor statistics and...

Ill-condensed Matter
  • Language: en
  • Pages: 644

Ill-condensed Matter

http://www.worldscientific.com/worldscibooks/10.1142/0031

Topics in Surface Chemistry
  • Language: en
  • Pages: 411

Topics in Surface Chemistry

The papers in this volume were presented at an international symposium on Topics in Surface Chemistry which was held in Bad Neuenahr, West Germany., September 7-9, 1977. The symposium was sponsored by IBM Germany. It has been recognized for many years that our understanding of bulk phenomena and their subsequent exploitation depends largely on our ability to define correlations between microscopic structure and the physical and chemical phenomena of interest. The role played by surface phenomena in the overall behavior of a material has been a subject for speculation for a long time, but only during the last decade or so have experimental and theor etical tools been developed which make it p...

Electron Microscopy
  • Language: en
  • Pages: 527

Electron Microscopy

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.