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Secondary Ion Mass Spectrometry
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Cumulative Book Index
A world list of books in the English language.
Consent
This volume presents a leading contribution to the substantive arena relating to consent in the criminal law. In broad terms, the ambit of legally valid consent in extant law is contestable and opaque, and reveals significant problems in adoption of consistent approaches to doctrinal and theoretical underpinnings of consent. This book seeks to provide a logical template to focus the debate. The overall concept addresses three specific elements within this arena, embracing an overarching synergy between them. This edifice engages in an examination of UK provisions, with specialist contributions on Irish and Scottish law, and in contrasting these provisions against alternative domestic jurisdi...
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Retford Through Time
This fascinating selection of photographs traces some of the many ways in which Retford has changed and developed over the last century.
Secondary Ion Mass Spectrometry SIMS VIII
The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.
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Surface Characterization of Advanced Polymers
Surface Characterization of Advanced Polymers Edited by Luigia Sabbatini and Pier Giorgio Zambonin This book provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern electron and ion spectroscopies (XPS, ToF-SIMS, ISS, HREELS). Case studies are critically discussed by well-known experts who propose strategies for the unequivocal interpretation of surface spectroscopic findings. Newcomers to the field will benefit from the extensive introductory chapter describing the fundamentals of spectroscopic techniques. This is a specialized book, written at an easily comprehensible level. It is recommended to all people involved in surface characterization and chemical analysis and, more generally, interested in polymer science and advanced materials. Professors at the University of Bari, Italy, Luigia, Sabbatini and Pier Giorgio Zambonin have published extensively in the field. Their research interests include electrosynthesis, spectroscopic characterization and applications of conducting and semiconducting polymers.
Characterization of Materials
Provides a survey of major characterization techniques used to determine composition and structure from raw materials to finished parts, as well as materials and structures in service. Characterization is essential at all stages of processing, design and use of materials.
