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With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.
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Focusing of Charged Particles, Volume I deals with the various aspects of problems in corpuscular optics such as the need for new focusing principles to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This volume is comprised of articles from specialists who attempt to find solutions to various problems in geometrical corpuscular optics. The topics discussed in the book include the general properties of potentials, fields and trajectories, the methods for resolving Laplace's and Poisson's equations and computing trajectories with or without space charge, and a description of the methods used for the measurement of magnetic fields. The optics of straight axis systems for producing and focusing low-intensity beams: high-brightness electron guns, electrostatic and magnetic electron lenses, and strong focusing lenses for high-energy beams are covered as well. The text ends with the elucidation of the problem of the production of electron microprobes. Physicists, students, researchers, and engineers working with charged particles will find the book invaluable.
This definitive work provides a comprehensive treatment of the mathematical background and working methods of three-dimensional reconstruction from tilt series. Special emphasis is placed on the problems presented by limitations of data collection in the transmission electron microscope. The book, extensively revised and updated, takes the reader from biological specimen preparation to three-dimensional images of the cell and its components.
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.
Expert coverage of vacuum microelectronics-principles, devices, and applications The field of vacuum microelectronics has advanced so swiftly that commercial devices are being fabricated, and applications are being developed in displays, wireless communications, spacecraft, and electronics for use in harsh environments. It is a rapidly evolving, interdisciplinary field encompassing electrical engineering, materials science, vacuum engineering, and applied physics. This book surveys the fundamentals, technology, and device applications of this nascent field. Editor Wei Zhu brings together some of the world's foremost experts to provide comprehensive and in-depth coverage of the entire spectru...
Advances in Electronics and Electron Physics
Covering a wide range of topics related to neutron and x-ray optics, this book explores the aspects of neutron and x-ray optics and their associated background and applications in a manner accessible to both lower-level students while retaining the detail necessary to advanced students and researchers. It is a self-contained book with detailed mathematical derivations, background, and physical concepts presented in a linear fashion. A wide variety of sources were consulted and condensed to provide detailed derivations and coverage of the topics of neutron and x-ray optics as well as the background material needed to understand the physical and mathematical reasoning directly related or indir...