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This book provides an introduction to statistical process control in automated manufacturing and suggests implementation strategies. It focuses on time series applications in statistical process control and explores the role of knowledge-based systems in process control.
This volume provides a detailed account of the tireless, dedicated work of a small group of missionaries sent to China by the American Churches of Christ early in the twentieth century. The account includes the difficult years of preparation (1921-1928), the establishment of the Canton Mission to the onset of the Japanese threat (1929-1937), the heroic efforts during the Japanese occupation and war years (1938-1945), and finally, the work after the war until the communist takeover (1946-1949). The emphasis is on the people and their work: The Bensons and the Oldhams, who opened the Canton Mission in 1929, the Davises and the Whitfields, who were valuable additions to the work starting in 1933, and the Leungs and the Sos, their dedicated Chinese coworkers for over a decade. Their philosophies and strategies for missionary work are highlighted, and the pioneering work with its successes, failures, and lessons learned, is discussed. Finally, an attempt is made to assess the significance of the Canton Mission of the Churches of Christ within the historical framework of the early Protestant mission work in China.
This book contains a broad selection of case studies written by professionals in the semiconductor industry that illustrate the use of statistical methods to improve manufacturing processes. These case studies offer engineers, scientists, technicians, and managers numerous examples of best-in-class practices by their peers. Because of the universal nature of statistical applications, the methods described here can be applied to a wide range of industries, including the chemical, biotechnology, automotive, steel, plastics, textile, and food industries. Many industries already benefit from the use of statistical methods, although the semiconductor industry is considered both a leader in and a model for the wide application and effective use of statistics.
Measurement error models describe functional relationships among variables observed, subject to random errors of measurement. This book treats general aspects of the measurement problem and features a discussion of the history of measurement error models.
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The Current Index to Statistics (CIS) is a bibliographic index of publications in statistics, probability, and related fields.
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