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Outlines the correct procedures for doing FMEAs and how to successfully apply them in design, development, manufacturing, and service applications There are a myriad of quality and reliability tools available to corporations worldwide, but the one that shows up consistently in company after company is Failure Mode and Effects Analysis (FMEA). Effective FMEAs takes the best practices from hundreds of companies and thousands of FMEA applications and presents streamlined procedures for veteran FMEA practitioners, novices, and everyone in between. Written from an applications viewpoint—with many examples, detailed case studies, study problems, and tips included—the book covers the most commo...
A unique, design-based approach to reliability engineering Design for Reliability provides engineers and managers with a range of tools and techniques for incorporating reliability into the design process for complex systems. It clearly explains how to design for zero failure of critical system functions, leading to enormous savings in product life-cycle costs and a dramatic improvement in the ability to compete in global markets. Readers will find a wealth of design practices not covered in typical engineering books, allowing them to think outside the box when developing reliability requirements. They will learn to address high failure rates associated with systems that are not properly des...
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mello...
Offers comprehensive insight into the theory, models, and techniques of ultra-dense networks and applications in 5G and other emerging wireless networks The need for speed—and power—in wireless communications is growing exponentially. Data rates are projected to increase by a factor of ten every five years—and with the emerging Internet of Things (IoT) predicted to wirelessly connect trillions of devices across the globe, future mobile networks (5G) will grind to a halt unless more capacity is created. This book presents new research related to the theory and practice of all aspects of ultra-dense networks, covering recent advances in ultra-dense networks for 5G networks and beyond, in...
Now in its second edition, Electronic Communications Systems provides electronics technologists with an extraordinarily complete, accurate, and timely introduction to all of the state-of-the-art technologies used in the communications field today. Comprehensive coverage includes traditional analog systems, as well as modern digital techniques. Extensive discussion of today's modern wireless systems - including cellular, radio, paging systems, and wireless data networks - is also included. In addition, sections on data communication and the internet, high-definition television, and fiber optics have been updated in this edition to enable readers to keep pace with the latest technological advancements. A block-diagram approach is emphasized throughout the book, with circuits included when helpful to lead readers to an understanding of fundamental principles. Instructive, step-by-step examples using MultiSIM?, in addition to those that use actual equipment and current manufacturer's specifications, are also included. Knowledge of basic algebra and trigonometry is assumed, yet no calculus is required.
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.
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