Welcome to our book review site go-pdf.online!
You may have to Search all our reviewed books and magazines, click the sign up button below to create a free account.
V. S. Naipaul's Journeys
The author of more than thirty books of fiction and nonfiction and winner of the Nobel Prize in Literature, V. S. Naipaul (1932–2018) is one of the most acclaimed authors of the twentieth century. He is also one of the most controversial. Before settling in England, Naipaul grew up in Trinidad in an Indian immigrant community, and his depiction of colonized peoples has often been harshly judged by critics as unsympathetic, misguided, racist, and sexist. Yet other readers praise his work as containing uncommonly perceptive historical and psychological insight. In V. S. Naipaul’s Journeys, Sanjay Krishnan offers new perspectives on the distinctiveness and power of Naipaul’s writing, as w...
Nanoelectronics and Photonics
Nanoelectronics and Photonics provides a fundamental description of the core elements and problems of advanced and future information technology. The authoritative book collects a series of tutorial chapters from leaders in the field covering fundamental topics from materials to devices and system architecture, and bridges the fundamental laws of physics and chemistry of materials at the atomic scale with device and circuit design and performance requirements.
Bias Temperature Instability for Devices and Circuits
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11
This issue of ECS Transactions contains the peer-reviewed full length papers of the International Symposium on Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics held May 1-6, 2011 in Montreal as a part of the 219th Meeting of The Electrochemical Society. The papers address a very diverse range of topics. In addition to the deposition and characterization of the dielectrics, more specific topics addressed by the papers include applications, device characterization and reliability, interface states, interface traps, defects, transistor and gate oxide studies, and modeling.
Fundamentals of Bias Temperature Instability in MOS Transistors
This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characterization techniques for recovery artefact free BTI measurements. It also covers different direct measurements techniques to access pre-existing and newly generated gate insulator traps responsible for BTI. The book provides a consi...
Parallel and Distributed Processing
This book constitutes the refereed proceedings of 11 IPPS/SPDP '98 Workshops held in conjunction with the 13th International Parallel Processing Symposium and the 10th Symposium on Parallel and Distributed Processing in San Juan, Puerto Rico, USA in April 1999. The 126 revised papers presented were carefully selected from a wealth of papers submitted. The papers are organised in topical sections on biologically inspired solutions to parallel processing problems: High-Level Parallel Programming Models and Supportive Environments; Biologically Inspired Solutions to Parallel Processing; Parallel and Distributed Real-Time Systems; Run-Time Systems for Parallel Programming; Reconfigurable Architectures; Java for Parallel and Distributed Computing; Optics and Computer Science; Solving Irregularly Structured Problems in Parallel; Personal Computer Based Workstation Networks; Formal Methods for Parallel Programming; Embedded HPC Systems and Applications.
Circuit Design for Reliability
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
The Chemistry and Technology of Solid Rocket Propellants (A Treatise on Solid Propellants)
The book is a treatise on solid propellants in nine chapters, covering the history, chemistry, energetics, processing and characterization aspects of composite solid propellants, internal ballistics, advanced solid propellants, safety, quality and reliability and homogenous or double base propellants. The book also traces the evolution of solid propellant technology in ISRO for launch vehicles and sounding rockets. There is a detailed table of contents, expanded index, glossary, exhaustive references and questions in each chapter. It can be used as a textbook for science and engineering students, as a reference book for researchers and as a companion to scientists and engineers working in the research, development and production areas of solid propellants.
